G01R 31/2648
Characterising semiconductor materials
Official title: {Characterising semiconductor materials (testing of materials or semi-finished products G01R31/2831; testing during manufacture H10P74/00)}
G01R31/2648 (Characterising semiconductor materials) appears on 349 US grants and 276 published applications in this corpus.
Search patents in G01R- Granted patents
- 349
- Published applications
- 276
- Assignees
- 206
- Inventors
- 703
- Latest grant
- 22 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1979 | 1 | 0 |
| 1980 | 0 | 0 |
| 1981 | 2 | 0 |
| 1982 | 0 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 1 | 0 |
| 1986 | 0 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 0 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 2 | 0 |
| 1994 | 2 | 0 |
| 1995 | 3 | 0 |
| 1996 | 11 | 0 |
| 1997 | 10 | 0 |
| 1998 | 14 | 0 |
| 1999 | 5 | 0 |
| 2000 | 19 | 0 |
| 2001 | 12 | 2 |
| 2002 | 9 | 12 |
| 2003 | 11 | 8 |
| 2004 | 12 | 13 |
| 2005 | 16 | 17 |
| 2006 | 21 | 17 |
| 2007 | 9 | 13 |
| 2008 | 16 | 18 |
| 2009 | 9 | 12 |
| 2010 | 15 | 16 |
| 2011 | 7 | 7 |
| 2012 | 8 | 12 |
| 2013 | 6 | 11 |
| 2014 | 8 | 15 |
| 2015 | 16 | 15 |
| 2016 | 13 | 8 |
| 2017 | 11 | 4 |
| 2018 | 7 | 12 |
| 2019 | 10 | 7 |
| 2020 | 11 | 8 |
| 2021 | 10 | 8 |
| 2022 | 5 | 8 |
| 2023 | 8 | 12 |
| 2024 | 13 | 9 |
| 2025 | 7 | 9 |
| 2026 | 9 | 3 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Carrier-resolved hall measurement with multi-harmonic magnetoresistance analysis22 Sep 2026US 12,742,812 B2International Business Machines Corporation
- Method for testing total dose effect of SiC MOSFET device25 Aug 2026US 12,716,933 B2China Academy of Space Technology
- Device and method for inhibiting a substrate current in an IC semiconductor substrate25 Aug 2026US 12,720,829 B2Elmos Semiconductor AG
- Systems and methods for carving probed metrology18 Aug 2026US 12,710,466 B2Arizona Board of Regents on behalf of Arizona State University
- Wide bandgap semiconductor characterization based on capacitance characteristics acquired using corona surface charge neutralization by UV radiation pulses9 Jun 2026US 12,650,458 B1Onto Innovation SDI LLC
- Semiconductor sample evaluation method, semiconductor sample evaluation device and semiconductor wafer manufacturing method6 Aug 2026US 2026/0231734 A1Sumco Corporation
- Semiconductor device, method for monitoring propagation length, and method for manufacturing semiconductor device30 Jul 2026US 2026/0223392 A1Renesas Electronics Corporation
- Position measurement method and device18 Jun 2026US 2026/0168822 A1Brightest Technology Taiwan Co., Ltd.
- Integrated current monitor using variable drain-to-source voltages9 Oct 2025US 2025/0314691 A1NVIDIA Corporation
- Circuit for monitoring degradation of a semiconductor device3 Jul 2025US 2025/0216439 A1Infineon Technologies AG
Most cited
By later US patents
- Method and apparatus for handling wafers162US 5,479,108 A1995
- Method for transporting and testing wafers131US 5,670,888 A1997
- Steady state method for measuring the thickness and the capacitance of ultra thin dielectric in the presence of substantial leakage current104US 6,597,193 B2Semiconductor Diagnostics, Inc. · 2003
- Steady state method for measuring the thickness and the capacitance of ultra thin dielectric in the presence of substantial leakage current97US 6,680,621 B2Semiconductor Diagnostics, Inc. · 2004
- Work function controlled probe for measuring properties of a semiconductor wafer and method of use thereof96US 7,023,231 B2Solid State Measurements, Inc. · 2006