G01R 31/2601
Apparatus or methods therefor
Official title: {Apparatus or methods therefor (G01R31/2607, G01R31/2642 take precedence)}
G01R31/2601 (Apparatus or methods therefor) appears on 689 US grants and 802 published applications in this corpus.
Search patents in G01R- Granted patents
- 689
- Published applications
- 802
- Assignees
- 360
- Inventors
- 1,709
- Latest grant
- 6 Oct 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 1 | 0 |
| 1977 | 0 | 0 |
| 1978 | 1 | 0 |
| 1979 | 0 | 0 |
| 1980 | 2 | 0 |
| 1981 | 0 | 0 |
| 1982 | 1 | 0 |
| 1983 | 2 | 0 |
| 1984 | 3 | 0 |
| 1985 | 2 | 0 |
| 1986 | 0 | 0 |
| 1987 | 1 | 0 |
| 1988 | 7 | 0 |
| 1989 | 1 | 0 |
| 1990 | 1 | 0 |
| 1991 | 2 | 0 |
| 1992 | 2 | 0 |
| 1993 | 1 | 0 |
| 1994 | 0 | 0 |
| 1995 | 2 | 0 |
| 1996 | 5 | 0 |
| 1997 | 1 | 0 |
| 1998 | 3 | 0 |
| 1999 | 0 | 0 |
| 2000 | 3 | 0 |
| 2001 | 0 | 1 |
| 2002 | 2 | 3 |
| 2003 | 2 | 2 |
| 2004 | 2 | 3 |
| 2005 | 1 | 4 |
| 2006 | 5 | 4 |
| 2007 | 2 | 4 |
| 2008 | 2 | 3 |
| 2009 | 7 | 10 |
| 2010 | 2 | 14 |
| 2011 | 10 | 11 |
| 2012 | 5 | 19 |
| 2013 | 25 | 48 |
| 2014 | 20 | 52 |
| 2015 | 40 | 90 |
| 2016 | 63 | 44 |
| 2017 | 52 | 38 |
| 2018 | 49 | 51 |
| 2019 | 43 | 58 |
| 2020 | 54 | 53 |
| 2021 | 54 | 51 |
| 2022 | 52 | 60 |
| 2023 | 42 | 42 |
| 2024 | 46 | 53 |
| 2025 | 40 | 52 |
| 2026 | 28 | 32 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Test tray for semiconductor devices and test apparatus using the same6 Oct 2026US 12,754,227 B2Ateco Inc.
- Semiconductor test apparatus6 Oct 2026US 12,754,228 B2Samsung Electronics Co., Ltd.
- Semiconductor test device and semiconductor test system22 Sep 2026US 12,742,794 B2Olum Material Corporation
- Carrier-resolved hall measurement with multi-harmonic magnetoresistance analysis22 Sep 2026US 12,742,812 B2International Business Machines Corporation
- Small device testing using thermesthesiometer22 Sep 2026US 12,742,815 B2SanDisk Technologies LLC
- Cantilever holder structure with attached electrical components for a cantilever-card assembly and methods of forming the same8 Oct 2026US 2026/0309748 A1Taiwan Semiconductor Manufacturing Company.Ltd
- Enhancing laser safety of time of flight (tof) sensor in extended reality (xr) devices10 Sep 2026US 2026/0266970 A1QUALCOMM Incorporated
- Semiconductor device27 Aug 2026US 2026/0251692 A1Infineon Technologies Austria AG
- Semiconductor device20 Aug 2026US 2026/0243815 A1Fuji Electric Co., Ltd.
- Methods of connecting a probe card to a probe pad located in saw street of a semiconductor wafer6 Aug 2026US 2026/0231738 A1Skyworks Solutions, Inc.
Most cited
By later US patents
- Testing of semiconductor chips with microbumps1,870US 9,372,206 B2Taiwan Semiconductor Manufacturing Company.Ltd · 2016
- Method of manufacturing a semiconductor device113US 7,105,365 B2Semiconductor Energy Laboratory Co.Ltd. · 2006
- Electron-beam probing of photodiodes86US 4,730,158 ASanta Barbara Research Center · 1988
- Method and apparatus for I-V data acquisition from solar cells62US 4,528,503 AThe United States of America as represented by the Department of Energy · 1985
- Test apparatus for electronic components58US 6,104,203 ATrio-Tech International · 2000