G01R 31/2603
For curve tracing of semiconductor characteristics
Official title: {for curve tracing of semiconductor characteristics, e.g. on oscilloscope}
G01R31/2603 (For curve tracing of semiconductor characteristics) appears on 66 US grants and 52 published applications in this corpus.
Search patents in G01R- Granted patents
- 66
- Published applications
- 52
- Assignees
- 52
- Inventors
- 150
- Latest grant
- 16 Sep 2025
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 1 | 0 |
| 1977 | 0 | 0 |
| 1978 | 0 | 0 |
| 1979 | 0 | 0 |
| 1980 | 1 | 0 |
| 1981 | 0 | 0 |
| 1982 | 0 | 0 |
| 1983 | 2 | 0 |
| 1984 | 1 | 0 |
| 1985 | 1 | 0 |
| 1986 | 0 | 0 |
| 1987 | 1 | 0 |
| 1988 | 5 | 0 |
| 1989 | 1 | 0 |
| 1990 | 1 | 0 |
| 1991 | 1 | 0 |
| 1992 | 1 | 0 |
| 1993 | 1 | 0 |
| 1994 | 0 | 0 |
| 1995 | 2 | 0 |
| 1996 | 2 | 0 |
| 1997 | 1 | 0 |
| 1998 | 1 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 1 |
| 2002 | 0 | 0 |
| 2003 | 1 | 1 |
| 2004 | 1 | 2 |
| 2005 | 1 | 1 |
| 2006 | 1 | 0 |
| 2007 | 0 | 1 |
| 2008 | 1 | 1 |
| 2009 | 2 | 1 |
| 2010 | 0 | 2 |
| 2011 | 0 | 0 |
| 2012 | 2 | 3 |
| 2013 | 7 | 7 |
| 2014 | 2 | 3 |
| 2015 | 2 | 3 |
| 2016 | 2 | 1 |
| 2017 | 3 | 1 |
| 2018 | 1 | 3 |
| 2019 | 0 | 0 |
| 2020 | 1 | 1 |
| 2021 | 4 | 5 |
| 2022 | 2 | 4 |
| 2023 | 3 | 2 |
| 2024 | 3 | 7 |
| 2025 | 4 | 1 |
| 2026 | 0 | 1 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Machine learning model training using de-noised data and model prediction with noise correction16 Sep 2025US 12,416,662 B2Tektronix, Inc.
- Analyzing an operation of a power semiconductor device1 Jul 2025US 12,345,754 B2Maschinenfabrik Reinhausen GmbH
- Testing apparatus and testing method13 May 2025US 12,298,340 B2Fuji Electric Co., Ltd.
- Wedge amplitude-modulation probe card and a main body thereof6 May 2025US 12,292,456 B2Maxone Semiconductor Co., Ltd.
- Method and device for measuring semiconductor multilayer structure based on second harmonic10 Dec 2024US 12,165,931 B2Shanghai Aspiring Semiconductor Equipment Co., Ltd.
- Photovoltaic module model parameter identification method and system11 Jun 2026US 2026/0163522 A1China National Electric Apparatus Research Institute Co., Ltd.
- Techniques for waveform detection of periodic signals using voltage contrast27 Feb 2025US 2025/0069842 A1FEI Company
- Method for measuring current-voltage characteristic3 Oct 2024US 2024/0329111 A1Rohm Co., Ltd.
- Testing apparatus and testing method2 May 2024US 2024/0142510 A1Fuji Electric Co., Ltd.
- De-skew method for dynamic testing using transfer function of current sensor29 Feb 2024US 2024/0069070 A1Keysight Technologies, Inc.
Most cited
By later US patents
- Electron-beam probing of photodiodes86US 4,730,158 ASanta Barbara Research Center · 1988
- Method and apparatus for I-V data acquisition from solar cells62US 4,528,503 AThe United States of America as represented by the Department of Energy · 1985
- DC biasing and AC loading of high gain frequency transistors54US 5,495,180 AThe United States of America as represented by the Secretary of the Air Force · 1996
- Electronic device test method and apparatus30US 4,775,640 AAmerican Telephone and Telegraph Company · 1988
- I-V Curve tracer employing parametric sampling28US 4,456,880 A1984