Wedge amplitude-modulation probe card and a main body thereof

A wedge amplitude-modulation probe card, wherein:

• it comprises a probe card main body, upper wedge plates and lower wedge plates, several upper wedge plates and several lower wedge plates are slidably arranged inside the probe card main body, and the several upper wedge plates and the several lower wedge plates are sequentially arranged at intervals in a staggered manner;
• the probe card main body comprises a main body frame, a probe slot, and an upper wedge plate slot;
• the main body frame internally accommodates several upper wedge plates and lower wedge plates along the length direction, and the bottom of the main body frame is provided with a probe slot for the probes to pass through along the length direction;
• The main body frame is also provided with an upper wedge plate slot for the upper wedge plates to be exposed partially;
• the upper wedge plate comprises:
• an upper wedge plate body, an upper wedge plate wedge, upper wedge plate probes, and upper wedge plate contacts;
• the lower end of the upper wedge plate body is provided with an upper wedge plate wedge, and both sides of the upper wedge plate wedge extend to the two sides of the upper wedge plate body;
• the lower end of the upper wedge plate wedge is provided with upper wedge plate probes, and one end of the upper wedge plate contacts is connected to the upper wedge plate probes, and the other end of the upper wedge plate contacts is exposed from one side of the upper wedge plate body;
• the lower wedge plate comprises:
• a lower wedge plate body, a lower wedge plate wedge, lower wedge plate probes, and lower wedge plate contacts;
• the upper end of the lower wedge plate body is provided with a lower wedge plate wedge, and both sides of the lower wedge plate wedge extend to the two sides of the lower wedge plate body;
• the lower end of the lower wedge plate wedge is provided with lower wedge plate probes, and one end of the lower wedge plate contacts is connected to the lower wedge plate probes, and the other end of the lower wedge plate contacts is exposed from one side of the lower wedge plate body;
• the probe spacing required for the contacts to be tested is defined as the standard probe spacing;
• the thickness of the upper wedge plate body and the lower wedge plate body are standard probe spacing, the probe card main body is provided with several fixed contacts at intervals at one side corresponding to the upper wedge plate contacts and lower wedge plate contacts, and one end of the several fixed contacts is connected with the testing circuit board, and the other end of the fixed contacts extends to the interior of the main body frame, and the spacing between the adjacent fixed contacts is the standard probe spacing.