De-skew method for dynamic testing using transfer function of current sensor

A dynamic test method, comprising:

• de-skewing first and second voltage probes and a current measurement cable connected to respective first, second and third channels of an oscilloscope;
• configuring a dynamic test set-up of a device under test (DUT) including the oscilloscope, the de-skewed first and second voltage probes, and the de-skewed current measurement cable, wherein the dynamic test set-up further includes a current sensor connected between the DUT and the current measurement cable;
• conducting a dynamic test of the DUT to obtain a current waveform displayed on the oscilloscope;
• and
• de-embedding the current waveform by using the oscilloscope to apply a transfer function of the current sensor to the current waveform to obtain a de-embedded current waveform displayed on the oscilloscope.