Small device testing using thermesthesiometer
AssigneeSanDisk Technologies LLC
InventorsRohan Shirsat, Ankur Agrawal
Life of this patent
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Abstract
A thermal measurement system includes a temperature-controlled chamber configured to house a Device Under Test (DUT) and a first temperature sensor to measure an external temperature of the DUT inside the temperature-controlled chamber. The thermal measurement system further includes a heating device for heating a test material outside the temperature-controlled chamber and a controller configured to control the heating device to heat the test material to the external temperature measured by the first temperature sensor of the DUT inside the temperature-controlled chamber. In one aspect, a thermethesiometer indicates a skin effect of a surface temperature of the test material outside the temperature-controlled chamber.
Claims20
A thermal measurement system, comprising:
- a temperature-controlled chamber configured to house a Device Under Test (DUT);
- means to measure an external temperature of the DUT inside the temperature-controlled chamber;
- means to indicate a skin effect of a surface temperature of a test material outside the temperature-controlled chamber;
- means to measure a temperature of the test material outside the temperature-controlled chamber;
- and
- a controller configured to control the means to heat the test material to the external temperature measured by the means to measure an external temperature of the DUT inside the temperature-controlled chamber.
A method for measuring a temperature of a test material, the method comprising:
- placing a test material outside of a temperature-controlled chamber to a target temperature with a first temperature sensor and a heating device contacting the test material;
- placing a Device Under Test (DUT) in the chamber with a second temperature sensor contacting an exterior surface of the DUT;
- connecting the DUT to a host outside of the chamber;
- and
- closing the chamber and initiating heating to a target temperature.
A thermal measurement system, comprising:
- a temperature-controlled chamber for housing a Device Under Test (DUT);
- a first temperature sensor configured to measure an external temperature of the DUT inside the temperature-controlled chamber;
- and
- a thermethesiometer disposed outside of the chamber and configured to indicate a skin effect of a surface temperature of a test material outside of the chamber.
Dependencies are inferred from the claim text.