Test tray for semiconductor devices and test apparatus using the same
AssigneeAteco Inc.
InventorsTaek Seon Lee, Ho Nam Kim, Sung Chul Moon, Han Su Bae, Ju Hyun Kim
Life of this patent
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Abstract
Disclosed is a test tray to which a semiconductor device is mounted according to an embodiment of the disclosure, the test tray including: a plurality of inserts to which the semiconductor devices are mounted; and a frame which supports the inserts in arrangement respectively corresponding to sockets of a test apparatus and has a length in a first axis and a width in a second axis.
Claims11
A test tray to which a semiconductor device with terminals located on a lateral surface thereof is mounted, the test tray comprising:
- a plurality of inserts to which the semiconductor devices are mounted;
- and
- a frame which supports the inserts in arrangement respectively corresponding to sockets of a test apparatus and has a length in a first axis and a width in a second axis,
- the inserts comprising:
- a mounting block to which the semiconductor device is mounted with the lateral surface having an angle to a plane formed by the first axis and the second axis;
- and
- a push unit which moves the semiconductor device in a pushing direction to be spaced apart from the mounting block.
An insert, to which a semiconductor device with terminals located on a lateral surface thereof is mounted, and which receives an external force to push the semiconductor device, the insert comprising:
- a mounting block to which the semiconductor device is mounted with the lateral surface facing in a pushing direction intersecting a direction where the external force is applied;
- and
- a push unit which receives the external force and moves the semiconductor device in the pushing direction to be spaced apart from the mounting block.
Dependencies are inferred from the claim text.