G01R 31/2644
Adaptations of individual semiconductor devices to facilitate the testing thereof
Official title: {Adaptations of individual semiconductor devices to facilitate the testing thereof}
G01R31/2644 (Adaptations of individual semiconductor devices to facilitate the testing thereof) appears on 159 US grants and 183 published applications in this corpus.
Search patents in G01R- Granted patents
- 159
- Published applications
- 183
- Assignees
- 103
- Inventors
- 445
- Latest grant
- 28 Jul 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1977 | 1 | 0 |
| 1978 | 2 | 0 |
| 1979 | 0 | 0 |
| 1980 | 0 | 0 |
| 1981 | 0 | 0 |
| 1982 | 0 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 0 | 0 |
| 1986 | 1 | 0 |
| 1987 | 0 | 0 |
| 1988 | 2 | 0 |
| 1989 | 2 | 0 |
| 1990 | 0 | 0 |
| 1991 | 2 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 1 | 0 |
| 1995 | 0 | 0 |
| 1996 | 1 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 1 | 0 |
| 2000 | 0 | 0 |
| 2001 | 1 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 3 |
| 2004 | 0 | 0 |
| 2005 | 1 | 2 |
| 2006 | 3 | 1 |
| 2007 | 0 | 0 |
| 2008 | 1 | 0 |
| 2009 | 0 | 0 |
| 2010 | 0 | 1 |
| 2011 | 0 | 1 |
| 2012 | 0 | 10 |
| 2013 | 4 | 5 |
| 2014 | 4 | 10 |
| 2015 | 12 | 17 |
| 2016 | 16 | 17 |
| 2017 | 12 | 14 |
| 2018 | 14 | 16 |
| 2019 | 14 | 13 |
| 2020 | 10 | 15 |
| 2021 | 16 | 16 |
| 2022 | 13 | 7 |
| 2023 | 7 | 11 |
| 2024 | 9 | 8 |
| 2025 | 4 | 8 |
| 2026 | 5 | 8 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Semiconductor device, method of testing the same, and method of designing the same28 Jul 2026US 12,696,732 B2Renesas Electronics Corporation
- Semiconductor device including switch control circuit that controls switches based on test setting signal and method of manufacturing the same7 Jul 2026US 12,674,834 B2Renesas Electronics Corporation
- Device variation extraction chip26 May 2026US 12,638,491 B2Shanghai Hauli Integrated Circuit Corporation
- Semiconductor package and method of testing the same26 May 2026US 12,638,492 B2Samsung Electronics Co., Ltd.
- Semiconductor device and method for diagnosing deterioration of semiconductor device24 Feb 2026US 12,564,112 B2Mitsubishi Electric Corporation
- Gate charge de-embedding24 Sep 2026US 2026/0287639 A1X-FAB France SAS
- Semiconductor device, method for monitoring propagation length, and method for manufacturing semiconductor device30 Jul 2026US 2026/0223392 A1Renesas Electronics Corporation
- Teg device and cryogenic intrinsic characteristics analysis method for quantitative evaluation for impact of high-k based passivation layer on electrical properies of 2d fet structure25 Jun 2026US 2026/0177604 A1Korea University Research and Business Foundation, Sejong Campus
- Wafer with light emitting elements, method of inspecting light emitting elements, and method of manufacturing light emitting elements4 Jun 2026US 2026/0156996 A1LG Display Co., Ltd.
- Substrate testing apparatus21 May 2026US 2026/0140162 A1Samsung Electronics Co., Ltd.
Most cited
By later US patents
- Apparatus and methods for semiconductor IC failure detection92US 7,067,335 B2KLA-Tencor Technologies Corporation · 2006
- E-beam inspection apparatus and method of using the same on various integrated circuit chips76US 9,496,119 B1PDF Solutions, Inc. · 2016
- Semiconductor device including threshold voltage measurement circuitry74US 10,107,854 B2Atomera Incorporated · 2018
- Method for making a semiconductor device including threshold voltage measurement circuitry66US 10,191,105 B2Atomera Incorporated · 2019
- Apparatus and methods for semiconductor IC failure detection66US 6,995,393 B2KLA-Tencor Technologies Corporation · 2006