Self-test and status reporting system for microcontroller-controlled devices

In an electrical device with at least one power supply and a plurality of component groups, an internal test system comprising:

• a microcontroller adapted to control the power on and off of each component group of the plurality of component groups one at a time;
• a current sensor adapted to measure the amount of current drawn by each component group of the plurality of component groups as the component group is powered on and off by the microcontroller, the microcontroller comparing the amount of current drawn by each component group as measured by the current sensor with an expected current range for each component group;
• and
• an output adapted to report whether the amount of current drawn by each component group as measured by the current sensor is within the expected current range for each component group.

A method of testing a plurality of components in an electrical device with at least one power supply and one microcontroller, said method comprising:

• powering on and off each component of the plurality of components one at a time;
• measuring the amount of current drawn by each component as the component is powered on and off;
• comparing the amount of current drawn by each component with an expected current range for each component;
• and
• reporting whether the amount of current drawn by each component is within the expected current range for each component.