G01R 31/302
Contactless testing
Official title: Contactless testing {(G01R31/66 takes precedence)}
G01R31/302 (Contactless testing) appears on 2,794 US grants and 2,001 published applications in this corpus.
Search patents in G01R- Granted patents
- 2,794
- Published applications
- 2,001
- Assignees
- 867
- Inventors
- 4,863
- Latest grant
- 29 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 6 | 0 |
| 1977 | 8 | 0 |
| 1978 | 3 | 0 |
| 1979 | 3 | 0 |
| 1980 | 8 | 0 |
| 1981 | 6 | 0 |
| 1982 | 6 | 0 |
| 1983 | 6 | 0 |
| 1984 | 17 | 0 |
| 1985 | 8 | 0 |
| 1986 | 21 | 0 |
| 1987 | 29 | 0 |
| 1988 | 35 | 0 |
| 1989 | 47 | 0 |
| 1990 | 31 | 0 |
| 1991 | 47 | 0 |
| 1992 | 52 | 0 |
| 1993 | 45 | 0 |
| 1994 | 32 | 0 |
| 1995 | 70 | 0 |
| 1996 | 58 | 0 |
| 1997 | 57 | 0 |
| 1998 | 63 | 0 |
| 1999 | 58 | 0 |
| 2000 | 71 | 0 |
| 2001 | 78 | 33 |
| 2002 | 98 | 86 |
| 2003 | 106 | 79 |
| 2004 | 101 | 82 |
| 2005 | 97 | 117 |
| 2006 | 111 | 142 |
| 2007 | 95 | 109 |
| 2008 | 105 | 93 |
| 2009 | 64 | 83 |
| 2010 | 81 | 81 |
| 2011 | 68 | 81 |
| 2012 | 45 | 53 |
| 2013 | 48 | 40 |
| 2014 | 61 | 69 |
| 2015 | 63 | 70 |
| 2016 | 57 | 64 |
| 2017 | 88 | 61 |
| 2018 | 72 | 68 |
| 2019 | 82 | 71 |
| 2020 | 84 | 86 |
| 2021 | 89 | 93 |
| 2022 | 77 | 79 |
| 2023 | 66 | 81 |
| 2024 | 70 | 58 |
| 2025 | 70 | 84 |
| 2026 | 31 | 38 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Testing apparatus for high-rate transmission and reception of signals between device under test and semiconductor testing apparatus29 Sep 2026US 12,748,144 B2Advantest Corporation
- Laser perturbation probing1 Sep 2026US 12,724,062 B2Advanced Micro Devices, Inc.
- System and method for performing characterization of a sample18 Aug 2026US 12,710,490 B2Onto Innovation Inc.
- Laser-induced hot carrier injection (HCI) for accelerated aging of integrated circuits11 Aug 2026US 12,704,545 B2Intel Corporation
- Test load board11 Aug 2026US 12,704,546 B2Texas Instruments Incorporated
- System and method for rapid inspection of printed circuit board using multiple modalities8 Oct 2026US 2026/0309776 A1Battelle Memorial Institute
- Neutron event rate detector8 Oct 2026US 2026/0309880 A1Raytheon Company
- Voltage contrast for backside processes on wafers1 Oct 2026US 2026/0299019 A1Intel Corporation
- Method for testing a packaging substrate, and apparatus for testing a packaging substrate17 Sep 2026US 2026/0276702 A1
- Inspection method, inspection apparatus, and inspection system17 Sep 2026US 2026/0276703 A1Tokyo Electron Limited
Most cited
By later US patents
- Method and apparatus for wireless radio frequency testing of RFID integrated circuits290US 6,236,223 B1Intermec IP Corp. · 2001
- Electron beam inspection system and method257US 5,502,306 AKLA Instruments Corporation · 1996
- Method and system for conducting contactless payment card transactions257US 7,424,977 B2Mastercard International Incorporated · 2008
- Feature-based defect detection256US 6,539,106 B1APPLIED Materials.Inc. · 2003
- Apparatus for non-conductively interconnecting integrated circuits using half capacitors233US 5,629,838 APolychip, Inc. · 1997