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US 12,724,062 B2Granted
Laser perturbation probing
AssigneeAdvanced Micro Devices, Inc.
InventorsRavikumar Venkat Krishnan, Gopinath Ranganathan, Jiann Min Chin
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Abstract
The disclosed method includes waveform extractions from a cross-talking environment by measuring a signal from a target circuit/transistor while deterministically stimulating a second circuit using a second laser and post-processing. The method includes analyzing the measured signal detecting a fault or an error in one of the circuits based on the analysis. Various other methods, systems, and computer-readable media are also disclosed.
Claims15
A laser perturbation probing system for testing a circuit system, comprising:
- a first laser configured to emit a first pulse to a first location;
- a second laser configured to emit a second pulse to a second location independently from the first laser;
- a detector;
- and
- a control system configured to:
- stimulate, using the first pulse from the first laser, a first circuit of the circuit system that is at the first location;
- measure a signal, using the second pulse from the second laser and the detector, from a target circuit of the circuit system that is at the second location and receives a data signal from the first circuit;
- analyze the measured signal;
- and
- detect an error in the circuit system based on the analysis.
7 more elements
Dependencies are inferred from the claim text.