Testing apparatus for high-rate transmission and reception of signals between device under test and semiconductor testing apparatus
AssigneeAdvantest Corporation
InventorDaisuke Watanabe
Life of this patent
Estimating the term…
Abstract
A testing apparatus includes a driver and a test signal providing section. The driver is connected electrically to a device under test and arranged to provide a test signal to the device under test. The test signal providing section is arranged to provide the test signal to the driver. The driver is closer than the test signal providing section to the device under test. A bandwidth of communication between the driver and the test signal providing section is broader than a bandwidth of communication between the driver and the device under test.
Claims26
A testing apparatus, comprising:
- a driver connected electrically to a device under test and arranged to provide a test signal to the device under test;
- and
- a test signal providing section arranged to provide the test signal to the driver, wherein
- the driver is closer than the test signal providing section to the device under test, and
- a bandwidth of communication between the driver and the test signal providing section is broader than a bandwidth of communication between the driver and the device under test.
A testing apparatus, comprising:
- a receiver connected electrically to a device under test and arranged to receive an output signal from the device under test and provide an output based on the output signal;
- and
- a signal under test receiving section arranged to receive the output from the receiver, wherein
- the receiver is closer than the signal under test receiving section to the device under test, and
- a bandwidth of communication between the receiver and the signal under test receiving section is broader than a bandwidth of communication between the receiver and the device under test.
A testing apparatus, comprising:
- a driver connected electrically to a device under test and arranged to provide a test signal to the device under test;
- a receiver connected electrically to the device under test and arranged to receive an output signal from the device under test and provide an output based on the output signal;
- a test signal providing section arranged to provide the test signal to the driver;
- and
- a signal under test receiving section arranged to receive the output from the receiver, wherein
- the driver is closer than the test signal providing section to the device under test,
- the receiver is closer than the signal under test receiving section to the device under test,
- a bandwidth of communication between the driver and the test signal providing section is broader than a bandwidth of communication between the driver and the device under test, and
- a bandwidth of communication between the receiver and the signal under test receiving section is broader than a bandwidth of communication between the receiver and the device under test.
Dependencies are inferred from the claim text.