System and method for performing characterization of a sample

A method for measuring at least one property including a magnetic property of a target sample using at least one of time-resolved magneto-optical Kerr effect (MOKE) measurements, ellipsometry measurements, or a combination thereof, the method comprising:

• generating a pulsed light beam with a pulsed light source;
• selecting a pump arm to receive at least a portion of the pulsed light beam and irradiate the target sample with one or more pump pulses to cause transient perturbation in the target sample or not selecting the pump arm so that the target sample is not irradiated with the one or more pump pulses;
• receiving at least a portion of the pulsed light beam in a probe arm and irradiating the target sample with one or more polarized probe pulses to produce reflected probe pulses, the probe arm comprising a phase modulator configured to periodically phase modulate the one or more polarized probe pulses;
• detecting reflected probe pulses from the target sample with one or more detectors;
• and
• determining an effect on polarization states of the probe pulses based on the reflected probe pulses due to magnetic property of the target sample for the time-resolved MOKE measurements if the pump arm is selected and determining an effect on polarization states of the probe pulses based on the reflected probe pulses due to non-magnetic properties of the target sample for the ellipsometry measurements if the pump arm is not selected.

An apparatus for measuring at least one property including a magnetic property of a target sample using at least one of time-resolved magneto-optical Kerr effect (MOKE) measurements, ellipsometry measurements, or a combination thereof, the apparatus comprising:

• means for generating a pulsed light beam;
• means for selecting a pump arm to receive at least a portion of the pulsed light beam and irradiate the target sample with one or more pump pulses to cause transient perturbation in the target sample and or not selecting the pump arm so that the target sample is not irradiated with the one or more pump pulses;
• means for receiving at least a portion of the pulsed light beam in a probe arm and irradiating the target sample with one or more polarized probe pulses to produce reflected probe pulses, the probe arm comprising a phase modulator configured to periodically phase modulate the one or more polarized probe pulses;
• means for detecting reflected probe pulses from the target sample;
• and
• means for determining an effect on polarization states of the probe pulses based on the reflected probe pulses due to magnetic property of the target sample for the time-resolved MOKE measurements if the pump arm is selected and determining an effect on polarization states of the probe pulses based on the reflected probe pulses due to non-magnetic properties of the target sample for the ellipsometry measurements if the pump arm is not selected.