G01R 31/308
Using non-ionising electromagnetic radiation
Official title: using non-ionising electromagnetic radiation, e.g. optical radiation {(investigating or analysing materials by the use of optical means G01N21/00; image analysis G06T7/00)}
G01R31/308 (Using non-ionising electromagnetic radiation) appears on 1,415 US grants and 989 published applications in this corpus.
Search patents in G01R- Granted patents
- 1,415
- Published applications
- 989
- Assignees
- 559
- Inventors
- 2,617
- Latest grant
- 29 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 3 | 0 |
| 1977 | 7 | 0 |
| 1978 | 2 | 0 |
| 1979 | 1 | 0 |
| 1980 | 4 | 0 |
| 1981 | 3 | 0 |
| 1982 | 1 | 0 |
| 1983 | 1 | 0 |
| 1984 | 9 | 0 |
| 1985 | 3 | 0 |
| 1986 | 10 | 0 |
| 1987 | 15 | 0 |
| 1988 | 14 | 0 |
| 1989 | 19 | 0 |
| 1990 | 17 | 0 |
| 1991 | 24 | 0 |
| 1992 | 29 | 0 |
| 1993 | 25 | 0 |
| 1994 | 23 | 0 |
| 1995 | 48 | 0 |
| 1996 | 32 | 0 |
| 1997 | 32 | 0 |
| 1998 | 37 | 0 |
| 1999 | 33 | 0 |
| 2000 | 48 | 0 |
| 2001 | 41 | 17 |
| 2002 | 60 | 46 |
| 2003 | 60 | 40 |
| 2004 | 58 | 46 |
| 2005 | 45 | 51 |
| 2006 | 55 | 63 |
| 2007 | 34 | 41 |
| 2008 | 52 | 41 |
| 2009 | 22 | 36 |
| 2010 | 34 | 42 |
| 2011 | 26 | 30 |
| 2012 | 19 | 23 |
| 2013 | 24 | 21 |
| 2014 | 21 | 34 |
| 2015 | 27 | 37 |
| 2016 | 22 | 28 |
| 2017 | 35 | 36 |
| 2018 | 29 | 38 |
| 2019 | 47 | 31 |
| 2020 | 42 | 50 |
| 2021 | 43 | 56 |
| 2022 | 42 | 46 |
| 2023 | 34 | 43 |
| 2024 | 44 | 31 |
| 2025 | 41 | 45 |
| 2026 | 18 | 17 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Testing apparatus for high-rate transmission and reception of signals between device under test and semiconductor testing apparatus29 Sep 2026US 12,748,144 B2Advantest Corporation
- Laser perturbation probing1 Sep 2026US 12,724,062 B2Advanced Micro Devices, Inc.
- System and method for performing characterization of a sample18 Aug 2026US 12,710,490 B2Onto Innovation Inc.
- Laser-induced hot carrier injection (HCI) for accelerated aging of integrated circuits11 Aug 2026US 12,704,545 B2Intel Corporation
- System and method for rapid inspection of printed circuit board using multiple modalities14 Jul 2026US 12,681,080 B2Battelle Memorial Institute
- System and method for rapid inspection of printed circuit board using multiple modalities8 Oct 2026US 2026/0309776 A1Battelle Memorial Institute
- Inspection method, inspection apparatus, and inspection system17 Sep 2026US 2026/0276703 A1Tokyo Electron Limited
- Test apparatus having probe card with optical test elements and related methods10 Sep 2026US 2026/0266872 A1Taiwan Semiconductor Manufacturing Company.Ltd
- Method for testing a packaging substrate, and apparatus for testing a packaging substrate13 Aug 2026US 2026/0235700 A1
- Method of detecting defective semiconductor package13 Aug 2026US 2026/0237054 A1Samsung Electronics Co., Ltd.
Most cited
By later US patents
- Method and system for conducting contactless payment card transactions257US 7,424,977 B2Mastercard International Incorporated · 2008
- Laser imaging system for inspection and analysis of sub-micron particles219US 5,479,252 AUltrapointe Corporation · 1995
- Test analysis apparatus and analysis method for semiconductor wafer using OBIC analysis203US 5,493,236 AMitsubishi Denki Kabushiki Kaisha · 1996
- Inspection system for cross-sectional imaging201US 5,592,562 AInternational Business Machines Corporation · 1997
- Surface inspection system188US 5,864,394 AKLA-Tencor Corporation · 1999