Inspection system for cross-sectional imaging
AssigneeInternational Business Machines Corporation
InventorStephen M. Rooks
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AssigneeInternational Business Machines Corporation
InventorStephen M. Rooks
Estimating the term…
A method and apparatus for inspecting a bonded joint between components. A cross-sectional image of the joint is analyzed by determining the location of a first characteristic of the joint, the centroid of the joint in the cross-sectional image; and then measuring a second characteristic of the joint in reference to the location of the centroid. This measurement may be used by comparing it with a predetermined specification expected for the measurement for the purpose of determining the quality of the joint. The invention is particularly advantageous for studying cross-sectional X-ray images of solder joints between electronic components and substrata upon which they are mounted and can be implemented for analyzing the images produced in cross-sectional X-ray inspection machines such as scanned beam X-ray laminography systems or digital tomosynthesis systems.
A method of inspecting a solder joint of a ball-grid array comprising the steps of:
A method of inspecting a soldered joint of a ball-grid array comprising joining a package and a substrate, having one or more connection pads, comprising:
Apparatus for inspecting a solder joint of a ball-grid array, using cross-sectional images of said joint generated in planes intersecting said joint at ball, pad, and package slices, comprising:
Apparatus for inspecting a soldered joint of a ball-grid array joining a package and a substrate, having one or more connection pads, comprising:
Dependencies are inferred from the claim text.