G01R 31/315
By inductive methods
Official title: by inductive methods
G01R31/315 (By inductive methods) appears on 97 US grants and 85 published applications in this corpus.
Search patents in G01R- Granted patents
- 97
- Published applications
- 85
- Assignees
- 77
- Inventors
- 209
- Latest grant
- 28 Apr 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1982 | 1 | 0 |
| 1983 | 1 | 0 |
| 1984 | 1 | 0 |
| 1985 | 0 | 0 |
| 1986 | 0 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 1 | 0 |
| 1990 | 1 | 0 |
| 1991 | 1 | 0 |
| 1992 | 1 | 0 |
| 1993 | 1 | 0 |
| 1994 | 0 | 0 |
| 1995 | 3 | 0 |
| 1996 | 3 | 0 |
| 1997 | 1 | 0 |
| 1998 | 1 | 0 |
| 1999 | 1 | 0 |
| 2000 | 1 | 0 |
| 2001 | 7 | 3 |
| 2002 | 3 | 4 |
| 2003 | 3 | 3 |
| 2004 | 2 | 4 |
| 2005 | 6 | 3 |
| 2006 | 3 | 4 |
| 2007 | 4 | 3 |
| 2008 | 2 | 2 |
| 2009 | 2 | 4 |
| 2010 | 4 | 4 |
| 2011 | 3 | 7 |
| 2012 | 2 | 3 |
| 2013 | 1 | 1 |
| 2014 | 6 | 4 |
| 2015 | 2 | 3 |
| 2016 | 2 | 3 |
| 2017 | 6 | 2 |
| 2018 | 4 | 4 |
| 2019 | 0 | 6 |
| 2020 | 6 | 2 |
| 2021 | 2 | 2 |
| 2022 | 4 | 4 |
| 2023 | 1 | 3 |
| 2024 | 3 | 2 |
| 2025 | 0 | 3 |
| 2026 | 1 | 2 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Crack detector for semiconductor dies28 Apr 2026US 12,613,274 B2STMicroelectronics International N. V.
- Method of detecting a fault in a pulsed power distribution system17 Dec 2024US 12,169,215 B2Panduit Corp.
- Apparatus and system for generating magnetic fields in inaccessible regions16 Jul 2024US 12,038,457 B2Keysight Technologies, Inc.
- Method of detecting a fault in a pulsed power distribution system5 Mar 2024US 11,921,146 B2Panduit Corp.
- Alternative near-field gradient probe for the suppression of radio frequency interference22 Aug 2023US 11,733,281 B2
- Parallel contactless testing of interposers and silicon bridges20 Aug 2026US 2026/0243821 A1Advantest Corporation
- Measuring device for characterising a measurement object in a vacuum using an inductive sensor in electromagnetic transmission15 Jan 2026US 2026/0016279 A1SURAGUS GmbH
- Semiconductor wafer testing apparatus25 Sep 2025US 2025/0298055 A1Kioxia Corporation
- High-resolution sensing of local magnetic fields and temperature in rf current carrying devices18 Sep 2025US 2025/0291008 A1Qnami AG
- Method of detecting a fault in a pulsed power distribution system13 Mar 2025US 2025/0085327 A1Panduit Corp.
Most cited
By later US patents
- Magnetoresistive sensor element and method of assembling magnetic field sensor elements with on-wafer functional test112US 7,323,870 B2Infineon Technologies AG · 2008
- Contactless test method for testing printed circuit boards101US 5,218,294 AAdvanced Test Technologies Inc. · 1993
- Printed circuit board tester using magnetic induction92US 5,631,572 ATeradyne, Inc. · 1997
- Contactless test method and system for testing printed circuit boards78US 5,424,633 AAdvanced Test Technologies Inc. · 1995
- Contactless test method and system for testing printed circuit boards71US 5,517,110 AYentec Inc. · 1996