Test load board
AssigneeTexas Instruments Incorporated
InventorsPastor Jose Yllana, Jr., Dale Ohmart
Life of this patent
Estimating the term…
Abstract
A test load board includes a PCB (printed circuit board) with pads for a probe of a tester. The test load board also includes a contactor that includes contact points for connecting leads of a DUT (device under test). The test load board further includes an RFID (radio frequency identification) tag affixed to the PCB. The RFID tag is loaded with a unique identifier (ID) of the test load board.
Claims20
A test load board comprising:
- a PCB (printed circuit board) with pads for a probe of a tester;
- a contactor that includes contact points for connecting leads of a DUT (device under test);
- and
- an RFID (radio frequency identification) tag affixed to the PCB, wherein the RFID tag is loaded with a unique identifier (ID) of the test load board.
A non-transitory machine-readable medium having machine-readable instructions for a test load board manager causing a processor core to execute operations, the operations comprising:
- providing a query for a unique ID (identifier) for a test load board to an RFID (radio frequency identifier) reader, wherein the RFID reader generates a wireless signal to query an RFID tag on the test load board responsive to receiving the query;
- receiving the unique ID for the test load board in response to the providing;
- and
- querying a database for a record of the test load board based on the unique ID of the test load board.
A method for testing integrated circuit (IC) packages, the method comprising:
- scanning, with a RFID (radio frequency identification) reader, an RFID tag mounted on a test load board with a PCB (printed circuit board) with pads for a probe of a tester and a contactor that includes contact points for connecting a leads of a DUT (device under test);
- determining, with test load board manager operating on a computing platform, a unique ID (identifier) of the test load board based on the scanning;
- inserting, by a handler, an IC (integrated circuit) package into the contactor;
- and
- testing, by a tester, the inserted IC package.
A method for testing integrated circuit (IC) packages, the method comprising:
- scanning, with a RFID (radio frequency identification) reader, an RFID tag mounted on a test load board with a PCB (printed circuit board) with pads for a probe of a tester and a contactor that includes contact points for connecting a leads of a DUT (device under test);
- determining, with test load board manager operating on a computing platform, a unique ID (identifier) of the test load board based on the scanning;
- inserting, by a handler, a first IC (integrated circuit) package in the contactor;
- testing, by a tester, the first inserted IC package;
- adding, by the test load board manager, data characterizing the unique ID of the load test board to a lot file for testing a lot of IC packages that includes the IC package;
- providing, by the test load board manager, the lot file to the tester, wherein the testing is executed in response to the providing;
- removing, by the handler, the first IC package from the contactor;
- inserting, by the handler, a second IC package in the contactor;
- and
- testing, by the tester, the second IC package inserted in the contactor.
Dependencies are inferred from the claim text.