G01R 31/2832
Specific tests of electronic circuits not provided for elsewhere
Official title: {Specific tests of electronic circuits not provided for elsewhere (G01R31/2801, G01R31/316 take precedence)}
G01R31/2832 (Specific tests of electronic circuits not provided for elsewhere) appears on 2,298 US grants and 2,246 published applications in this corpus.
Search patents in G01R- Granted patents
- 2,298
- Published applications
- 2,246
- Assignees
- 1,018
- Inventors
- 5,476
- Latest grant
- 6 Oct 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 6 | 0 |
| 1977 | 10 | 0 |
| 1978 | 9 | 0 |
| 1979 | 4 | 0 |
| 1980 | 5 | 0 |
| 1981 | 9 | 0 |
| 1982 | 6 | 0 |
| 1983 | 7 | 0 |
| 1984 | 10 | 0 |
| 1985 | 12 | 0 |
| 1986 | 10 | 0 |
| 1987 | 14 | 0 |
| 1988 | 9 | 0 |
| 1989 | 8 | 0 |
| 1990 | 10 | 0 |
| 1991 | 8 | 0 |
| 1992 | 16 | 0 |
| 1993 | 20 | 0 |
| 1994 | 15 | 0 |
| 1995 | 23 | 0 |
| 1996 | 20 | 0 |
| 1997 | 19 | 0 |
| 1998 | 23 | 0 |
| 1999 | 39 | 0 |
| 2000 | 36 | 0 |
| 2001 | 60 | 5 |
| 2002 | 38 | 42 |
| 2003 | 25 | 40 |
| 2004 | 49 | 39 |
| 2005 | 37 | 47 |
| 2006 | 45 | 53 |
| 2007 | 39 | 53 |
| 2008 | 31 | 71 |
| 2009 | 36 | 72 |
| 2010 | 58 | 67 |
| 2011 | 45 | 83 |
| 2012 | 59 | 81 |
| 2013 | 70 | 72 |
| 2014 | 72 | 82 |
| 2015 | 69 | 106 |
| 2016 | 89 | 85 |
| 2017 | 81 | 94 |
| 2018 | 104 | 115 |
| 2019 | 103 | 118 |
| 2020 | 122 | 145 |
| 2021 | 137 | 134 |
| 2022 | 131 | 105 |
| 2023 | 116 | 150 |
| 2024 | 137 | 155 |
| 2025 | 117 | 138 |
| 2026 | 80 | 94 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Controlling a power supply6 Oct 2026US 12,756,309 B2Teradyne, Inc.
- Tunable transconductor6 Oct 2026US 12,756,369 B2Texas Instruments Incorporated
- Testing apparatus for high-rate transmission and reception of signals between device under test and semiconductor testing apparatus29 Sep 2026US 12,748,144 B2Advantest Corporation
- Display device and inspecting method thereof29 Sep 2026US 12,749,419 B2Samsung Display Co., Ltd.
- Event detection system response controller8 Sep 2026US 12,730,141 B2Raytheon Company
- Method for predicting defect in semiconductor device8 Oct 2026US 2026/0309768 A1Samsung Electronics Co., Ltd.
- Test and/or measurement system8 Oct 2026US 2026/0309826 A1
- Electrical safety analyzer with multimodal guidance1 Oct 2026US 2026/0299009 A1Fluke Corporation
- Measurement test system, control system and method1 Oct 2026US 2026/0299010 A1Rohde & Schwarz GmbH & Co.KG
- Electronic system for testing an embedded application, and communication method1 Oct 2026US 2026/0299011 A1STMicroelectronics International N. V.
Most cited
By later US patents
- Self-test and status reporting system for microcontroller-controlled devices1,247US 6,104,304 AConexant Systems, Inc. · 2000
- Motorized system integrated control and diagnostics using vibration, pressure, temperature, speed, and/or current analysis245US 7,539,549 B1Rockwell Automation Technologies, Inc. · 2009
- Block diagram system and method for controlling electronic instruments with simulated graphic display213US 5,155,836 A1992
- Disk drive test chamber205US 5,851,143 AThermal Industries, Inc. · 1998
- Method for manufacturing test simulation in electronic circuit design195US 5,539,652 AHewlett-Packard Company · 1996