G01R 31/2834
Automated test systems [ate]
Official title: {Automated test systems [ATE]; using microprocessors or computers (G01R31/317 takes precedence; ATE for detection of defective computer hardware G06F11/2736)}
G01R31/2834 (Automated test systems [ate]) appears on 777 US grants and 731 published applications in this corpus.
Search patents in G01R- Granted patents
- 777
- Published applications
- 731
- Assignees
- 368
- Inventors
- 1,837
- Latest grant
- 6 Oct 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 2 | 0 |
| 1977 | 2 | 0 |
| 1978 | 4 | 0 |
| 1979 | 2 | 0 |
| 1980 | 3 | 0 |
| 1981 | 5 | 0 |
| 1982 | 5 | 0 |
| 1983 | 4 | 0 |
| 1984 | 5 | 0 |
| 1985 | 6 | 0 |
| 1986 | 8 | 0 |
| 1987 | 8 | 0 |
| 1988 | 8 | 0 |
| 1989 | 5 | 0 |
| 1990 | 7 | 0 |
| 1991 | 1 | 0 |
| 1992 | 8 | 0 |
| 1993 | 4 | 0 |
| 1994 | 4 | 0 |
| 1995 | 5 | 0 |
| 1996 | 9 | 0 |
| 1997 | 6 | 0 |
| 1998 | 6 | 0 |
| 1999 | 8 | 0 |
| 2000 | 11 | 0 |
| 2001 | 19 | 1 |
| 2002 | 10 | 14 |
| 2003 | 5 | 12 |
| 2004 | 16 | 13 |
| 2005 | 15 | 16 |
| 2006 | 10 | 16 |
| 2007 | 16 | 14 |
| 2008 | 10 | 21 |
| 2009 | 12 | 9 |
| 2010 | 14 | 14 |
| 2011 | 9 | 25 |
| 2012 | 9 | 12 |
| 2013 | 11 | 23 |
| 2014 | 19 | 25 |
| 2015 | 22 | 46 |
| 2016 | 33 | 33 |
| 2017 | 33 | 46 |
| 2018 | 45 | 44 |
| 2019 | 46 | 43 |
| 2020 | 47 | 46 |
| 2021 | 51 | 40 |
| 2022 | 37 | 31 |
| 2023 | 43 | 54 |
| 2024 | 43 | 54 |
| 2025 | 40 | 47 |
| 2026 | 26 | 32 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Controlling a power supply6 Oct 2026US 12,756,309 B2Teradyne, Inc.
- Tunable transconductor6 Oct 2026US 12,756,369 B2Texas Instruments Incorporated
- Manufacturing automatic test equipment and field ambient comparison with silicon lifecycle management support1 Sep 2026US 12,724,065 B1Synopsys, Inc.
- Wafer tester and wafer testing method and system18 Aug 2026US 12,710,467 B2Nanya Technology Corporation
- Method and system of developing and executing test program for verifying DUT18 Aug 2026US 12,710,468 B2Microtest S.p.A.
- Test and/or measurement system8 Oct 2026US 2026/0309826 A1
- Test method, test apparatus, and test system10 Sep 2026US 2026/0266894 A1KYOCERA Document Solutions Inc.
- Control of an automated test equipment based on temperature13 Aug 2026US 2026/0235661 A1Advantest Corporation
- Contactless testing of interposers and silicon bridges30 Jul 2026US 2026/0219310 A1Advantest Corporation
- Alignment system in electronic device testing30 Jul 2026US 2026/0219314 A1Delta Design, Inc.
Most cited
By later US patents
- Block diagram system and method for controlling electronic instruments with simulated graphic display213US 5,155,836 A1992
- Signal viewing instrumentation control system160US 4,812,996 ATektronix, Inc. · 1989
- Display for a remote receiver in an electrical utility load management system148US 4,780,910 AScientific-Atlanta, Inc. · 1988
- Display for remote receiver in a utility management system147US 5,099,348 AScientific-Atlanta, Inc. · 1992
- Block diagram editor system and method for controlling electronic instruments142US 4,868,785 ATektronix, Inc. · 1989