Manufacturing automatic test equipment and field ambient comparison with silicon lifecycle management support

A system, comprising:

• a control circuit to obtain a first profile associated with a first circuit by running a first shmoo test on the first circuit, wherein running the first shmoo test on the first circuit comprises:
• selecting an operating condition for testing the first circuit, wherein the operating condition for testing the first circuit includes noise and voltage drop conditions to be used during testing;
• selecting a set of circuits in proximity to the first circuit based on the noise and voltage drop conditions;
• running built-in self-test (BIST) on the set of circuits to generate the noise and voltage drop conditions in the first circuit in proximity to the first circuit;
• running BIST on the first circuit while BIST is running on the set of circuits in proximity to the first circuit;
• determining a first result of running the BIST on the first circuit;
• and
• associating the first result of running the BIST on the first circuit with the operating condition for testing the first circuit.

A non-transitory computer-readable medium comprising stored instructions, which when executed by a processor, cause the processor to generate a digital representation of an integrated circuit (IC), the IC comprising:

• a control circuit to obtain a first profile associated with a first circuit by running a first shmoo test on the first circuit, wherein running the first shmoo test on the first circuit comprises:
• selecting an operating condition for testing the first circuit, wherein the operating condition for testing the first circuit includes noise and voltage drop conditions to be used during testing;
• selecting a set of circuits in proximity to the first circuit based on the noise and voltage drop conditions, wherein the noise and voltage drop conditions are represented using an identifier which corresponds to the set of circuits in proximity to the first circuit;
• running built-in self-test (BIST) on the set of circuits to generate the noise and voltage drop conditions in the first circuit;
• running BIST on the first circuit while BIST is running on the set of circuits in proximity to the first circuit;
• determining a first result of running the BIST on the first circuit;
• and
• associating the first result of running the BIST on the first circuit with the operating condition for testing the first circuit.