Electronic system for testing an embedded application, and communication method

A method for communicating between a first electronic device, a second electronic device, and a test computer, wherein:

• the first electronic device comprises a first microcontroller having first pins, and at least one first electrical connector having first ports, each first port being electrically connected to at least one of the first pins;
• the second electronic device is separate from the first electronic device and is configured to communicate with at least the first electronic device and to receive and execute requests from the test computer, the second electronic device comprising a second microcontroller having second pins, and at least one second electrical connector having second ports, each second port being electrically connected to at least one of the second pins, the second electrical connector being electrically connected to the first electrical connector to communicate with the first electronic device;
• and
• the test computer is configured to communicate with at least the second electronic device and to consult at least one database to determine which of the second pins are electrically connected to each of the first pins,
• the method comprising:
• identifying, from said at least one database, the second pins electrically connected to a first identified pin associated with a main request to be transmitted;
• transmitting to the second electronic device, for each of the second pins electrically connected to the first identified pin, a request to interrogate a current state of the second microcontroller to execute the main request using said second pin;
• receiving from the second electronic device a response for each of the second pins electrically connected to the first identified pin, each response indicating the current state of the second microcontroller;
• selecting a second selected pin from the second pins electrically connected to the first identified pin according to the responses received;
• and
• transmitting to the second electronic device said main request that specifies the second selected pin, the second selected pin being electrically connected to the first identified pin.

An electronic system for testing an embedded application, comprising:

• a device under test comprising a first microcontroller having first pins;
• an auxiliary device separate from the device under test and electrically connected thereto, the auxiliary device comprising a second microcontroller having second pins, wherein one or more of the second pins are electrically connected to one or more of the first pins;
• and
• a test computer configured to:
• consult at least one database to identify second pins electrically connected to a target first pin associated with a request to be executed;
• transmit to the auxiliary device, for each of the identified second pins, an interrogation request to determine a current state of the second microcontroller for executing the request using said second pin;
• receive from the auxiliary device responses indicating the current state for each of the identified second pins;
• select one of the identified second pins based on the responses received;
• and
• transmit the request to the auxiliary device specifying the selected second pin for execution.