G01R 31/2836
Fault-finding or characterising
Official title: {Fault-finding or characterising (G01R31/2822 - G01R31/2831 take precedence)}
G01R31/2836 (Fault-finding or characterising) appears on 1,531 US grants and 1,514 published applications in this corpus.
Search patents in G01R- Granted patents
- 1,531
- Published applications
- 1,514
- Assignees
- 787
- Inventors
- 3,796
- Latest grant
- 29 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 3 | 0 |
| 1977 | 8 | 0 |
| 1978 | 5 | 0 |
| 1979 | 2 | 0 |
| 1980 | 2 | 0 |
| 1981 | 4 | 0 |
| 1982 | 2 | 0 |
| 1983 | 3 | 0 |
| 1984 | 5 | 0 |
| 1985 | 6 | 0 |
| 1986 | 2 | 0 |
| 1987 | 6 | 0 |
| 1988 | 2 | 0 |
| 1989 | 3 | 0 |
| 1990 | 3 | 0 |
| 1991 | 7 | 0 |
| 1992 | 8 | 0 |
| 1993 | 16 | 0 |
| 1994 | 10 | 0 |
| 1995 | 18 | 0 |
| 1996 | 12 | 0 |
| 1997 | 14 | 0 |
| 1998 | 17 | 0 |
| 1999 | 31 | 0 |
| 2000 | 26 | 0 |
| 2001 | 43 | 4 |
| 2002 | 30 | 29 |
| 2003 | 20 | 29 |
| 2004 | 34 | 27 |
| 2005 | 23 | 33 |
| 2006 | 38 | 38 |
| 2007 | 24 | 40 |
| 2008 | 22 | 51 |
| 2009 | 25 | 63 |
| 2010 | 44 | 53 |
| 2011 | 36 | 61 |
| 2012 | 51 | 67 |
| 2013 | 60 | 49 |
| 2014 | 56 | 53 |
| 2015 | 45 | 58 |
| 2016 | 48 | 50 |
| 2017 | 45 | 46 |
| 2018 | 58 | 71 |
| 2019 | 53 | 70 |
| 2020 | 74 | 96 |
| 2021 | 87 | 91 |
| 2022 | 94 | 78 |
| 2023 | 76 | 100 |
| 2024 | 96 | 104 |
| 2025 | 78 | 87 |
| 2026 | 56 | 66 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
- G01R 31/2839Using signal generators, power supplies or circuit analysers450
- G01R 31/2837Characterising or performance testing273
- G01R 31/2846Using hard- or software simulation or using knowledge-based systems265
- G01R 31/2849Environmental or reliability testing236
- G01R 31/2844Using test interfaces182
- G01R 31/2843In-circuit-testing113
Recent patents
- Testing apparatus for high-rate transmission and reception of signals between device under test and semiconductor testing apparatus29 Sep 2026US 12,748,144 B2Advantest Corporation
- Display device and inspecting method thereof29 Sep 2026US 12,749,419 B2Samsung Display Co., Ltd.
- Event detection system response controller8 Sep 2026US 12,730,141 B2Raytheon Company
- Method and device for monitoring thermal impedance25 Aug 2026US 12,716,856 B2Infineon Technologies AG
- Systems and methods for measuring waveforms at devices under test25 Aug 2026US 12,716,937 B2Keysight Technologies, Inc.
- Method for predicting defect in semiconductor device8 Oct 2026US 2026/0309768 A1Samsung Electronics Co., Ltd.
- Electrical safety analyzer with multimodal guidance1 Oct 2026US 2026/0299009 A1Fluke Corporation
- Measurement test system, control system and method1 Oct 2026US 2026/0299010 A1Rohde & Schwarz GmbH & Co.KG
- Electronic system for testing an embedded application, and communication method1 Oct 2026US 2026/0299011 A1STMicroelectronics International N. V.
- Deriving multiple step and impulse responses from pulse response analysis1 Oct 2026US 2026/0299012 A1Tektronix, Inc.
Most cited
By later US patents
- Self-test and status reporting system for microcontroller-controlled devices1,247US 6,104,304 AConexant Systems, Inc. · 2000
- Motorized system integrated control and diagnostics using vibration, pressure, temperature, speed, and/or current analysis245US 7,539,549 B1Rockwell Automation Technologies, Inc. · 2009
- Disk drive test chamber205US 5,851,143 AThermal Industries, Inc. · 1998
- Method for manufacturing test simulation in electronic circuit design195US 5,539,652 AHewlett-Packard Company · 1996
- Method for manufacturing a stimulus wafer for use in a wafer-to-wafer testing system to test integrated circuits located on a product wafer173US 5,701,666 AMotorola, Inc. · 1997