G01R 31/2843
In-circuit-testing
Official title: {In-circuit-testing}
G01R31/2843 (In-circuit-testing) appears on 113 US grants and 110 published applications in this corpus.
Search patents in G01R- Granted patents
- 113
- Published applications
- 110
- Assignees
- 101
- Inventors
- 324
- Latest grant
- 16 Jun 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1977 | 2 | 0 |
| 1978 | 1 | 0 |
| 1979 | 0 | 0 |
| 1980 | 1 | 0 |
| 1981 | 0 | 0 |
| 1982 | 0 | 0 |
| 1983 | 1 | 0 |
| 1984 | 1 | 0 |
| 1985 | 0 | 0 |
| 1986 | 1 | 0 |
| 1987 | 2 | 0 |
| 1988 | 0 | 0 |
| 1989 | 1 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 2 | 0 |
| 1997 | 1 | 0 |
| 1998 | 1 | 0 |
| 1999 | 1 | 0 |
| 2000 | 0 | 0 |
| 2001 | 3 | 1 |
| 2002 | 4 | 4 |
| 2003 | 2 | 1 |
| 2004 | 4 | 1 |
| 2005 | 0 | 0 |
| 2006 | 2 | 1 |
| 2007 | 0 | 1 |
| 2008 | 0 | 3 |
| 2009 | 1 | 3 |
| 2010 | 3 | 2 |
| 2011 | 2 | 3 |
| 2012 | 2 | 2 |
| 2013 | 2 | 5 |
| 2014 | 2 | 5 |
| 2015 | 6 | 4 |
| 2016 | 3 | 3 |
| 2017 | 2 | 1 |
| 2018 | 4 | 1 |
| 2019 | 4 | 6 |
| 2020 | 6 | 12 |
| 2021 | 9 | 12 |
| 2022 | 8 | 6 |
| 2023 | 8 | 7 |
| 2024 | 10 | 8 |
| 2025 | 7 | 12 |
| 2026 | 4 | 6 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Active bridge-based chiplet interconnect architecture with short-to-long converter circuit16 Jun 2026US 12,656,390 B2International Business Machines Corporation
- Test system for detecting faults in multiple devices of the same type5 May 2026US 12,618,895 B2NXP B. V.
- Control device and power conversion device for detecting failure of an AC capacitor10 Feb 2026US 12,549,084 B2TMEIC Corporation
- Diagnostic systems and methods3 Feb 2026US 12,540,969 B2The Boeing Company
- Continuously variable electronic load tester for use with nuclear instrumentation system high voltage power supplies23 Dec 2025US 12,504,469 B2Westinghouse Electric Corp.
- Determining an Aging State of a Contacting Layer of a Semiconductor Component and Semiconductor Assembly20 Aug 2026US 2026/0243730 A1Siemens Aktiengesellschaft
- Capacitor defect monitoring device, method of monitoring capacitor defect using the device and storage device using the device18 Jun 2026US 2026/0169057 A1Samsung Electronics Co., Ltd.
- In-Situ Electrical Connectivity Detection4 Jun 2026US 2026/0153557 A1Advanced Micro Devices, Inc.
- Method for detecting devices mounted on a baseboard4 Jun 2026US 2026/0153558 A1Jabil Circuit (Singapore) Pte. Ltd.
- Continuously variable electronic load tester for use with nuclear instrumentation system high voltage power supplies16 Apr 2026US 2026/0104452 A1Westinghouse Electric Corp.
Most cited
By later US patents
- Method and apparatus for measuring on-wafer lumped capacitances in integrated circuits82US 6,560,567 B12003
- Method of resonance analysis for electrical fault isolation27US 10,935,593 B2Intel Corporation · 2021
- Vehicle speed control circuit tester22US 4,220,912 ADana Corporation · 1980
- Apparatus for identifying defective electric power distribution capacitors21US 4,425,541 ACommonwealth Edison Company · 1984
- Programmable voltage divider and method for testing the impedance of a programmable element18US 5,952,833 AMicron Technology, Inc. · 1999