Diagnostic systems and methods
AssigneeThe Boeing Company
InventorMark Edward Nowakowski
Life of this patent
Estimating the term…
Abstract
A method of operating a diagnostic system includes applying electric fields to test sites within an active layer of a circuit and illuminating sensor sites within a sensor layer of the circuit. The sensor layer comprises crystallographic defects and the sensor sites are respectively aligned with the test sites. The method also includes determining intensities of photoluminescence detected from the crystallographic defects of the sensor sites. The intensities correspond to a frequency range of photoluminescence that is indicative of charge densities within the test sites. The method also includes generating output indicating the intensities at each of the sensor sites.
Claims20
A method of operating a diagnostic system, the method comprising:
- applying electric fields to test sites within an active layer of a circuit;
- illuminating sensor sites within a sensor layer of the circuit, wherein the sensor layer comprises crystallographic defects and the sensor sites are respectively aligned with the test sites;
- determining intensities of photoluminescence detected from the crystallographic defects of the sensor sites, wherein the intensities correspond to a frequency range of photoluminescence that is indicative of charge densities within the test sites;
- and
- generating output indicating the intensities at each of the sensor sites.
A non-transitory computer readable medium storing instructions that, when executed by a diagnostic system, cause the diagnostic system to perform functions comprising:
- applying electric fields to test sites within an active layer of a circuit;
- illuminating sensor sites within a sensor layer of the circuit, wherein the sensor layer comprises crystallographic defects and the sensor sites are respectively aligned with the test sites;
- determining intensities of photoluminescence detected from the crystallographic defects of the sensor sites, wherein the intensities correspond to a frequency range of photoluminescence that is indicative of charge densities within the test sites;
- and
- generating output indicating the intensities at each of the sensor sites.
A diagnostic system comprising:
- one or more processors;
- one or more power sources;
- one or more electrodes;
- one or more light sources;
- one or more photodetectors;
- a user interface;
- and
- a computer readable medium storing instructions that, when executed by the one or more processors, cause the diagnostic system to perform functions comprising:
- applying, via the one or more electrodes and the one or more power sources, electric fields to test sites within an active layer of a circuit;
- illuminating, via the one or more light sources, sensor sites within a sensor layer of the circuit, wherein the sensor layer comprises crystallographic defects and the sensor sites are respectively aligned with the test sites;
- determining, via the one or more photodetectors, intensities of photoluminescence detected from the crystallographic defects of the sensor sites, wherein the intensities correspond to a frequency range of photoluminescence that is indicative of charge densities within the test sites;
- and
- generating, via the user interface, output indicating the intensities at each of the sensor sites.
Dependencies are inferred from the claim text.