G01R 31/2849
Environmental or reliability testing
Official title: {Environmental or reliability testing, e.g. burn-in or validation tests (of individual semiconductors G01R31/2642; of printed circuits boards G01R31/2817; of IC's G01R31/2855)}
G01R31/2849 (Environmental or reliability testing) appears on 236 US grants and 208 published applications in this corpus.
Search patents in G01R- Granted patents
- 236
- Published applications
- 208
- Assignees
- 177
- Inventors
- 578
- Latest grant
- 25 Aug 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1984 | 1 | 0 |
| 1985 | 0 | 0 |
| 1986 | 0 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 0 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 1 | 0 |
| 1993 | 2 | 0 |
| 1994 | 2 | 0 |
| 1995 | 5 | 0 |
| 1996 | 2 | 0 |
| 1997 | 4 | 0 |
| 1998 | 7 | 0 |
| 1999 | 11 | 0 |
| 2000 | 10 | 0 |
| 2001 | 15 | 1 |
| 2002 | 4 | 6 |
| 2003 | 4 | 7 |
| 2004 | 7 | 2 |
| 2005 | 4 | 3 |
| 2006 | 5 | 6 |
| 2007 | 4 | 7 |
| 2008 | 2 | 5 |
| 2009 | 2 | 9 |
| 2010 | 5 | 13 |
| 2011 | 6 | 8 |
| 2012 | 8 | 12 |
| 2013 | 6 | 6 |
| 2014 | 8 | 8 |
| 2015 | 6 | 2 |
| 2016 | 4 | 3 |
| 2017 | 2 | 9 |
| 2018 | 14 | 15 |
| 2019 | 6 | 6 |
| 2020 | 11 | 17 |
| 2021 | 9 | 12 |
| 2022 | 17 | 12 |
| 2023 | 14 | 14 |
| 2024 | 15 | 13 |
| 2025 | 4 | 7 |
| 2026 | 9 | 5 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Method and device for monitoring thermal impedance25 Aug 2026US 12,716,856 B2Infineon Technologies AG
- Electronic device including dew condensation sensor18 Aug 2026US 12,710,389 B2LG Electronics Inc.
- Independent thermal controller for memory devices and device interface boards11 Aug 2026US 12,704,544 B2Micron Technology, Inc.
- Techniques for reduction of degradation in channels caused by bias temperature instability5 May 2026US 12,620,981 B2Altera Corporation
- Method of monitoring a health state of a power semiconductor device by monitoring inverter case temperature during steady state loading31 Mar 2026US 12,591,001 B2ROLLS-ROYCE plc
- Measurement test system, control system and method1 Oct 2026US 2026/0299010 A1Rohde & Schwarz GmbH & Co.KG
- Analog circuit having reconfiguration means for a stress test and/or for an iddq test, and associated methods3 Sep 2026US 2026/0259258 A1Elmos Semiconductor AG
- Techniques For Reduction Of Degradation In Channels Caused By Bias Temperature Instability20 Aug 2026US 2026/0246456 A1Altera Corporation
- Determining a lockout condition in a conducted electrical weapon4 Jun 2026US 2026/0153311 A1Axon Enterprise, Inc.
- Thermal regulating device16 Apr 2026US 2026/0107414 A1Northrop Grumman Systems Corporation
Most cited
By later US patents
- Disk drive test chamber205US 5,851,143 AThermal Industries, Inc. · 1998
- Method for manufacturing a stimulus wafer for use in a wafer-to-wafer testing system to test integrated circuits located on a product wafer173US 5,701,666 AMotorola, Inc. · 1997
- Storage device for objects, storage station and air-conditioned cabinet111US 6,129,428 AKendro Laboratory Products, LP · 2000
- Electronic component temperature test system with flat ring revolving carriage107US 5,451,884 ATransat Corp. · 1995
- Apparatus for testing electrical components103US 6,113,262 ATRW Inc. · 2000