G01R 31/2844
Using test interfaces
Official title: {using test interfaces, e.g. adapters, test boxes, switches, PIN drivers (G01R31/2889 takes precedence)}
G01R31/2844 (Using test interfaces) appears on 182 US grants and 191 published applications in this corpus.
Search patents in G01R- Granted patents
- 182
- Published applications
- 191
- Assignees
- 149
- Inventors
- 482
- Latest grant
- 18 Aug 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1977 | 1 | 0 |
| 1978 | 0 | 0 |
| 1979 | 0 | 0 |
| 1980 | 0 | 0 |
| 1981 | 1 | 0 |
| 1982 | 0 | 0 |
| 1983 | 0 | 0 |
| 1984 | 2 | 0 |
| 1985 | 0 | 0 |
| 1986 | 0 | 0 |
| 1987 | 1 | 0 |
| 1988 | 0 | 0 |
| 1989 | 0 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 4 | 0 |
| 1993 | 4 | 0 |
| 1994 | 1 | 0 |
| 1995 | 1 | 0 |
| 1996 | 0 | 0 |
| 1997 | 4 | 0 |
| 1998 | 5 | 0 |
| 1999 | 2 | 0 |
| 2000 | 3 | 0 |
| 2001 | 3 | 0 |
| 2002 | 3 | 3 |
| 2003 | 1 | 4 |
| 2004 | 3 | 3 |
| 2005 | 2 | 4 |
| 2006 | 7 | 6 |
| 2007 | 1 | 5 |
| 2008 | 2 | 6 |
| 2009 | 3 | 5 |
| 2010 | 7 | 1 |
| 2011 | 2 | 7 |
| 2012 | 5 | 9 |
| 2013 | 4 | 3 |
| 2014 | 6 | 2 |
| 2015 | 5 | 6 |
| 2016 | 2 | 4 |
| 2017 | 2 | 4 |
| 2018 | 6 | 10 |
| 2019 | 5 | 12 |
| 2020 | 9 | 11 |
| 2021 | 16 | 12 |
| 2022 | 9 | 9 |
| 2023 | 14 | 19 |
| 2024 | 17 | 18 |
| 2025 | 14 | 12 |
| 2026 | 5 | 16 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Modular positioner and/or fixture, measurement system and data processing program product for a device under test (DUT)18 Aug 2026US 12,710,469 B2Rohde & Schwarz GmbH & Co.KG
- Use of electromagnetic signature to determine the type of integrated circuit9 Jun 2026US 12,650,461 B2Ohio State Innovation Foundation
- Electronics part verification system26 May 2026US 12,638,496 B1
- Configurable radio frequency system21 Apr 2026US 12,607,660 B2Rohde & Schwarz GmbH & Co.KG
- Unified measurement system for static and dynamic characterization of a device under test17 Mar 2026US 12,578,379 B2Keithley Instruments, LLC
- Electrical safety analyzer with multimodal guidance1 Oct 2026US 2026/0299009 A1Fluke Corporation
- Measurement test system, control system and method1 Oct 2026US 2026/0299010 A1Rohde & Schwarz GmbH & Co.KG
- Electronic system for testing an embedded application, and communication method1 Oct 2026US 2026/0299011 A1STMicroelectronics International N. V.
- Method for remotely performing self-fault diagnosis in electric vehicle charging system and apparatus supporting same23 Jul 2026US 2026/0208616 A1BIONEVER Inc.
- Use of electromagnetic signature to determine the type of integrated circuit16 Jul 2026US 2026/0202464 A1Ohio State Innovation Foundation
Most cited
By later US patents
- Pin electronics test circuit for IC device testing72US 5,101,153 ANational Semiconductor Corporation · 1992
- System for and method of testing a microelectronic device using a dual probe technique68US 6,791,344 B2International Business Machines Corporation · 2004
- Ergonomic test apparatus for the operator-assisted testing of electronic devices59US 6,388,437 B12002
- Ergonomic test apparatus for the operator-assisted testing of electronic devices55US 6,566,859 B2Pemstar, Inc. · 2003
- Evaluation kit for medical monitoring module system and method51US 8,489,167 B2Covidien LP · 2013