Use of electromagnetic signature to determine the type of integrated circuit
AssigneeOhio State Innovation Foundation
InventorsRobert Lee, Aditya Nechiyil, Gregg Chapman
Life of this patent
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AssigneeOhio State Innovation Foundation
InventorsRobert Lee, Aditya Nechiyil, Gregg Chapman
Estimating the term…
Systems and methods for detecting anomalous integrated circuits (ICs) are provided. An electrical signature for each of multiple reference ICs are created using a resonator. Each IC may be associated with a different model or manufacturer. Later, when an IC that is suspected of being anomalous is received, its signature is generated and compared with a previously generated signature for an IC of the same make and manufacturer. When the signatures differ by more than a threshold amount, then the IC may be determined to be anomalous. In some embodiments, the generated signatures may be used to train a model that can determine whether an IC is anomalous based on its generated signature or can identify the make and manufacturer of an IC based on its generated signature.
A method comprising:
A system comprising:
Dependencies are inferred from the claim text.