Deriving multiple step and impulse responses from pulse response analysis

Abstract

A test and measurement instrument includes a port to allow the instrument to receive a signal from a device under test (DUT), one or more processors configured to execute code that causes the one or more processors to: acquire a waveform from the signal, derive a pattern waveform from the waveform using one of either hardware or software clock recovery, perform linear fit pulse response extraction on the pattern waveform to extract one or more linear fit pulse responses (LFPRs), determine at least one of one or more rising step responses and one or more falling step responses from each of the one or more LFPRs, evaluate the DUT based upon at least one of the one or more rising step responses and the one or more falling step responses, and adjust one or more of operation and design of the DUT based upon the evaluation.

Dependencies are inferred from the claim text.