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US 12,716,937 B2Granted
Systems and methods for measuring waveforms at devices under test
AssigneeKeysight Technologies, Inc.
InventorKenichi Takano
Life of this patent
Estimating the term…
Abstract
Methods, systems, and computer readable media for measuring voltage and current waveforms at devices under test. An example method includes outputting an electrical signal from a signal generator of a measurement instrument; measuring a first voltage at an input to an output resistance of the measurement instrument; measuring a second voltage at an output of the output resistance of the measurement instrument; and determining a test measurement voltage at a device under test (DUT) electrically connected to the measurement instrument using the first voltage, the second voltage, and a propagation delay of a transmission line electrically connecting the measurement instrument to the DUT.
Claims16
A method comprising:
- outputting an electrical signal from a signal generator of a measurement instrument;
- measuring a first voltage at an input to an output resistance of the measurement instrument, wherein measuring the first voltage comprises:
- closing a first switch between an analog-to-digital converter (ADC) and the input to the output resistance;
- opening a second switch between the ADC and the output to the output resistance;
- and
- measuring the first voltage using the ADC;
- measuring a second voltage at an output of the output resistance of the measurement instrument;
- and
- determining a test measurement voltage at a device under test (DUT) electrically connected to the measurement instrument using the first voltage, the second voltage, and a propagation delay of a transmission line electrically connecting the measurement instrument to the DUT.
6 more elements
A method comprising:
- outputting an electrical signal from a signal generator of a measurement instrument;
- measuring a first voltage at an input to an output resistance of the measurement instrument;
- measuring a second voltage at an output of the output resistance of the measurement instrument;
- determining a test measurement voltage at a device under test (DUT) electrically connected to the measurement instrument using the first voltage, the second voltage, and a propagation delay of a transmission line electrically connecting the measurement instrument to the DUT;
- and
- measuring a differential signal at the DUT by measuring a third voltage at a second input to a second output resistance and a further voltage at a second output to a second output resistance and using a second propagation delay of a second transmission line.
3 more elements
A system comprising:
- a measurement instrument comprising a signal generator configured for outputting an electrical signal;
- and
- a controller configured for:
- measuring a first voltage at an input to an output resistance of the measurement instrument, wherein measuring the first voltage comprises:
- closing a first switch between an analog-to-digital converter (ADC) and the input to the output resistance;
- opening a second switch between the ADC and the output to the output resistance;
- and
- measuring the first voltage using the ADC;
- measuring a second voltage at an output of the output resistance of the measurement instrument;
- and
- determining a test measurement voltage at a device under test (DUT) electrically connected to the measurement instrument using the first voltage, the second voltage, and a propagation delay of a transmission line electrically connecting the measurement instrument to the DUT.
8 more elements
A system comprising:
- a measurement instrument comprising a signal generator configured for outputting an electrical signal;
- and
- a controller configured for:
- measuring a first voltage at an input to an output resistance of the measurement instrument;
- measuring a second voltage at an output of the output resistance of the measurement instrument;
- and
- determining a test measurement voltage at a device under test (DUT) electrically connected to the measurement instrument using the first voltage, the second voltage, and a propagation delay of a transmission line electrically connecting the measurement instrument to the DUT, wherein the controller is configured for measuring a differential signal at the DUT by measuring a third voltage at a second input to a second output resistance and a further voltage at a second output to a second output resistance and using a second propagation delay of a second transmission line.
4 more elements
Dependencies are inferred from the claim text.