G01R 31/316
Testing of analog circuits
Official title: Testing of analog circuits {(G01R31/2851 takes precedence)}
G01R31/316 (Testing of analog circuits) appears on 299 US grants and 138 published applications in this corpus.
Search patents in G01R- Granted patents
- 299
- Published applications
- 138
- Assignees
- 174
- Inventors
- 585
- Latest grant
- 8 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 1 | 0 |
| 1977 | 7 | 0 |
| 1978 | 1 | 0 |
| 1979 | 8 | 0 |
| 1980 | 2 | 0 |
| 1981 | 1 | 0 |
| 1982 | 1 | 0 |
| 1983 | 2 | 0 |
| 1984 | 3 | 0 |
| 1985 | 3 | 0 |
| 1986 | 3 | 0 |
| 1987 | 11 | 0 |
| 1988 | 3 | 0 |
| 1989 | 6 | 0 |
| 1990 | 10 | 0 |
| 1991 | 9 | 0 |
| 1992 | 8 | 0 |
| 1993 | 8 | 0 |
| 1994 | 7 | 0 |
| 1995 | 5 | 0 |
| 1996 | 5 | 0 |
| 1997 | 11 | 0 |
| 1998 | 9 | 0 |
| 1999 | 5 | 0 |
| 2000 | 22 | 0 |
| 2001 | 12 | 3 |
| 2002 | 20 | 12 |
| 2003 | 9 | 10 |
| 2004 | 10 | 4 |
| 2005 | 4 | 5 |
| 2006 | 6 | 5 |
| 2007 | 5 | 11 |
| 2008 | 9 | 6 |
| 2009 | 5 | 10 |
| 2010 | 5 | 6 |
| 2011 | 3 | 4 |
| 2012 | 6 | 3 |
| 2013 | 4 | 3 |
| 2014 | 4 | 2 |
| 2015 | 2 | 1 |
| 2016 | 1 | 2 |
| 2017 | 3 | 1 |
| 2018 | 1 | 6 |
| 2019 | 2 | 5 |
| 2020 | 10 | 7 |
| 2021 | 3 | 5 |
| 2022 | 11 | 5 |
| 2023 | 1 | 4 |
| 2024 | 4 | 6 |
| 2025 | 4 | 5 |
| 2026 | 4 | 7 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Test circuit having separately arranged digital and analog circuits for testing a device under test8 Sep 2026US 12,730,145 B2Techwidu Co., Ltd.
- Test system for detecting faults in multiple devices of the same type5 May 2026US 12,618,895 B2NXP B. V.
- RF testing method and testing system21 Apr 2026US 12,607,671 B2Mediatek Inc.
- Analog parameter monitor3 Mar 2026US 12,566,196 B2Hewlett-Packard Development Company, L. P.
- Adaptive chip testing apparatus and formation method thereof2 Dec 2025US 12,487,251 B2Semight Instruments Co., Ltd
- Scan-based test circuitry for structural testing of analog and mixed-signal circuits10 Sep 2026US 2026/0266900 A1Siemens Industry Software Inc.
- Device with a Signal Amplifier Integrated Into a Semiconductor Chip27 Aug 2026US 2026/0251697 A1TDK-Micronas GmbH
- Methods for configuring a source apparatus and apparatuses for implementing the same13 Aug 2026US 2026/0235669 A1Schneider Electric Industries SAS
- Zero Ohm Output Impedance16 Apr 2026US 2026/0106589 A1National Instruments Corporation
- Driving High Speed Voltage Waveforms for Current Measurements16 Apr 2026US 2026/0106603 A1National Instruments Corporation
Most cited
By later US patents
- Compositions and methods for helper-free production of recombinant adeno-associated viruses184US 6,258,595 B1The Trustees of the University of Pennsylvania · 2001
- Compositions and methods for helper-free production of recombinant adeno-associated viruses144US 6,485,966 B2The Trustees of the University of Pennsylvania · 2002
- Compositions and methods for helper-free production of recombinant adeno-associated viruses144US 7,022,519 B2The Trustees of the University of Pennsylvania · 2006
- Method for final testing of semiconductor devices134US 5,589,765 ATexas Instruments Incorporated · 1996
- Method of repairing defective traces in an integrated circuit structure126US 5,725,995 AElm Technology Corporation · 1998