G01R 31/3163
Functional testing
G01R31/3163 (Functional testing) appears on 57 US grants and 48 published applications in this corpus.
Search patents in G01R- Granted patents
- 57
- Published applications
- 48
- Assignees
- 50
- Inventors
- 154
- Latest grant
- 8 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1994 | 3 | 0 |
| 1995 | 0 | 0 |
| 1996 | 3 | 0 |
| 1997 | 2 | 0 |
| 1998 | 2 | 0 |
| 1999 | 1 | 0 |
| 2000 | 2 | 0 |
| 2001 | 1 | 0 |
| 2002 | 3 | 2 |
| 2003 | 2 | 1 |
| 2004 | 1 | 1 |
| 2005 | 3 | 2 |
| 2006 | 2 | 2 |
| 2007 | 2 | 2 |
| 2008 | 3 | 3 |
| 2009 | 1 | 3 |
| 2010 | 0 | 3 |
| 2011 | 1 | 2 |
| 2012 | 3 | 1 |
| 2013 | 2 | 3 |
| 2014 | 3 | 0 |
| 2015 | 1 | 1 |
| 2016 | 0 | 2 |
| 2017 | 1 | 0 |
| 2018 | 1 | 0 |
| 2019 | 1 | 3 |
| 2020 | 4 | 3 |
| 2021 | 1 | 3 |
| 2022 | 4 | 2 |
| 2023 | 1 | 0 |
| 2024 | 0 | 3 |
| 2025 | 1 | 1 |
| 2026 | 2 | 5 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Test circuit having separately arranged digital and analog circuits for testing a device under test8 Sep 2026US 12,730,145 B2Techwidu Co., Ltd.
- RF testing method and testing system21 Apr 2026US 12,607,671 B2Mediatek Inc.
- Power source emulator and method for testing switchgear25 Nov 2025US 12,483,009 B2ModularMC, LLC
- Signal path monitor24 Jan 2023US 11,561,257 B2Allegro MicroSystems, LLC
- Method for diagnosing analog circuit fault based on vector-valued regularized kernel function approximation1 Nov 2022US 11,486,925 B2Hefei University of Technology
- Scan-based test circuitry for structural testing of analog and mixed-signal circuits10 Sep 2026US 2026/0266900 A1Siemens Industry Software Inc.
- Methods for configuring a source apparatus and apparatuses for implementing the same13 Aug 2026US 2026/0235669 A1Schneider Electric Industries SAS
- Driving High Speed Voltage Waveforms for Current Measurements16 Apr 2026US 2026/0106603 A1National Instruments Corporation
- Variable-bit adaptive sensing circuit system in analog neuromorphic systems9 Apr 2026US 2026/0099703 A1Korea University Research and Business Foundation
- Analog divider circuitry with built-in test capability19 Mar 2026US 2026/0079202 A1Skyworks Solutions, Inc.
Most cited
By later US patents
- Multi-chip module testing52US 5,321,277 ATexas Instruments Incorporated · 1994
- Analog functional safety with anomaly detection48US 10,685,159 B2Intel Corporation · 2020
- Semiconductor reliability test chip47US 6,320,201 B1Micron Technology, Inc. · 2001
- Analog signal monitor circuit and method45US 5,610,826 ATexas Instruments Incorporated · 1997
- Semiconductor reliability test chip45US 5,751,015 AMicron Technology, Inc. · 1998