Test circuit having separately arranged digital and analog circuits for testing a device under test

A test circuit configured to receive an inspection command from automatic test equipment (ATE) through an electrical connection and test a device under test (DUT) based on the inspection command, the test circuit comprising:

• a plurality of analog inspection circuits electrically connected to the DUT to test an operation thereof;
• and
• a digital control circuit configured to control operations of the analog inspection circuits,
• wherein the digital control circuit and the plurality of analog inspection circuits are located apart from each other,
• the test circuit further comprising a probe card,
• wherein the probe card includes a substrate on which the plurality of analog inspection circuits and the digital control circuit are disposed, the probe card including an analog signal processing area and a digital signal processing area, and the substrate including a first side and a second side,
• wherein the plurality of analog inspection circuits is located in the analog signal processing area, and the digital control circuit is located in the digital signal processing area, the digital signal processing area being distinct from the analog signal processing area,
• wherein the analog signal processing area is disposed on the first side,
• wherein the digital signal processing area is disposed on the second side, the second side being different from the first side, and
• wherein the digital control circuit comprises:
• a decoder configured to decode a digital command provided by a controller,
• an inspection circuit selector configured to select one of the analog inspection circuits to perform inspection according to the decoded digital command, and
• a command encoder configured to encode and provide an inspection circuit control command to control the analog inspection circuit to perform inspection.