RF testing method and testing system
AssigneeMediatek Inc.
InventorsJung-Yin Chien, Po-Yen Tseng, Pin-Lin Huang, Wen-Chih Chen
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AssigneeMediatek Inc.
InventorsJung-Yin Chien, Po-Yen Tseng, Pin-Lin Huang, Wen-Chih Chen
Estimating the term…
An RF testing method is applied between a testing instrument and multiple devices under test at least including a first DUT and a second DUT. The testing instrument includes a signal generator and a signal analyzer. A sync signal is sent to the testing instrument and the first DUT, so that the first DUT occupies the signal generator to receive a testing signal from the signal generator. The first DUT sends an uplink signal to the signal analyzer based on the testing signal to occupy the signal analyzer for signal analysis at a first point in time. The sync signal is sent to the testing instrument and the second DUT, so that the second DUT occupies the signal generator to receive the testing signal from the signal generator at a second point in time. The first point in time is parallel to the second point in time.
An RF testing method for a TX test, applied between a testing instrument and multiple devices under test (DUTs) at least comprising a first DUT and a second DUT, wherein the testing instrument comprises a signal generator and a signal analyzer, the method comprising:
An RF testing method for an RX test, applied between a testing instrument and multiple devices under test (DUTs) at least comprising a first DUT and a second DUT, wherein the testing instrument comprises a signal generator and a signal analyzer, the method comprising:
A testing system, comprising:
Dependencies are inferred from the claim text.