G01R 31/3161
Marginal testing
G01R31/3161 (Marginal testing) appears on 37 US grants and 21 published applications in this corpus.
Search patents in G01R- Granted patents
- 37
- Published applications
- 21
- Assignees
- 30
- Inventors
- 80
- Latest grant
- 3 Mar 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1977 | 1 | 0 |
| 1978 | 1 | 0 |
| 1979 | 0 | 0 |
| 1980 | 1 | 0 |
| 1981 | 0 | 0 |
| 1982 | 0 | 0 |
| 1983 | 0 | 0 |
| 1984 | 1 | 0 |
| 1985 | 0 | 0 |
| 1986 | 0 | 0 |
| 1987 | 2 | 0 |
| 1988 | 0 | 0 |
| 1989 | 3 | 0 |
| 1990 | 1 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 1 | 0 |
| 1994 | 2 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 1 | 0 |
| 1998 | 1 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 1 | 0 |
| 2002 | 3 | 0 |
| 2003 | 1 | 1 |
| 2004 | 1 | 1 |
| 2005 | 1 | 2 |
| 2006 | 0 | 1 |
| 2007 | 1 | 3 |
| 2008 | 1 | 1 |
| 2009 | 3 | 3 |
| 2010 | 1 | 2 |
| 2011 | 2 | 0 |
| 2012 | 0 | 0 |
| 2013 | 0 | 0 |
| 2014 | 0 | 1 |
| 2015 | 1 | 0 |
| 2016 | 0 | 0 |
| 2017 | 0 | 0 |
| 2018 | 0 | 1 |
| 2019 | 0 | 0 |
| 2020 | 2 | 0 |
| 2021 | 0 | 0 |
| 2022 | 1 | 3 |
| 2023 | 0 | 0 |
| 2024 | 2 | 1 |
| 2025 | 0 | 1 |
| 2026 | 1 | 0 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Analog parameter monitor3 Mar 2026US 12,566,196 B2Hewlett-Packard Development Company, L. P.
- Systems, methods, and devices for high-speed input/output margin testing6 Aug 2024US 12,055,584 B2Tektronix, Inc.
- Systems, methods, and devices for high-speed input/output margin testing12 Mar 2024US 11,927,627 B2Tektronix, Inc.
- Measurement method using radio frequency power amplifier27 Sep 2022US 11,456,711 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Apparatuses and methods involving error detection and correction of linear analog circuits17 Mar 2020US 10,591,536 B1NXP B. V.
- Analog environmental monitoring circuits and methods11 Sep 2025US 2025/0283938 A1Microsoft Technology Licensing, LLC
- Analog parameter monitor1 Feb 2024US 2024/0036088 A1Hewlett-Packard Development Company, L. P.
- Systems, methods, and devices for high-speed input/output margin testing26 May 2022US 2022/0163587 A1Tektronix, Inc.
- Systems, methods, and devices for high-speed input/output margin testing26 May 2022US 2022/0163588 A1Tektronix, Inc.
- Measurement method using radio frequency power amplifier3 Mar 2022US 2022/0069779 A1Taiwan Semiconductor Manufacturing Company.Ltd
Most cited
By later US patents
- Testing method and apparatus assuring semiconductor device quality and reliability43US 6,574,760 B1Texas Instruments Incorporated · 2003
- Methods for predicting reliability of semiconductor devices using voltage stressing25US 6,414,508 B1Adaptec, Inc. · 2002
- Power sensor module for microwave test systems24US 6,397,160 B1Teradyne, Inc. · 2002
- Test socket and method for producing known good dies using the test socket20US 5,644,247 ASamsung Electronics Co., Ltd. · 1997
- Electronic measuring system with pulsed power supply and stability sensing18US 4,238,784 AColt Industries Operating Corp. · 1980