Systems, methods, and devices for high-speed input/output margin testing
AssigneeTektronix, Inc.
InventorsDaniel S. Froelich, Sam J. Strickling
Life of this patent
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Abstract
A system for data creation, storage, analysis, and training while margin testing includes a margin test generator coupled through an interface to a Device Under Test (DUT). The margin test generator is structured to modify test signals for testing the DUT during one or more testing states of a test session to create testing results. The testing results are stored in a data repository along with a DUT identifier of the DUT tested during the test session. A comparator determine whether any results of the DUT test results match a predictive outcome that is based from an analysis of previous DUT tests. If so, a message generator produces an indication that the tested DUT matched the predictive outcome.
Claims18
A test device, comprising:
- at least one test interface structured to connect to a device under test (DUT);
- one or more controllers structured to generate margin test signals for testing the DUT during one or more testing states of a test session;
- a data repository structured to store results of the testing of the DUT during the one or more testing states of the test session along with a DUT identifier of the DUT tested during the test session;
- the one or more controllers further structured to determine whether any results of the testing of the DUT match a predictive outcome, wherein the predictive outcome is generated from an analysis of results of previous testing of the DUT and one or more other DUTs as well as data about an operational lifetime of the one or more other DUTs;
- and
- a user interface operatively coupled to the test device and structured to display an indication that the results of the testing of the DUT matched the predictive outcome, wherein the indication includes a predicted operational life of the DUT.
A method of operating a test device, comprising:
- establishing a connection to a device under test (DUT);
- generating test signals for margin testing the DUT during one or more testing states of a test session, wherein the test signals are communicated with the DUT via the connection;
- storing results of the testing of the DUT during the one or more testing states of the test session in a library along with a DUT identifier of the DUT tested during the test session;
- determining whether any results of the testing of the DUT match a predictive outcome, wherein the predictive outcome is generated from an analysis of results of previous testing of the DUT and one or more other DUTs as well as data about an operational lifetime of the one or more other DUTs;
- and
- when any results of the testing of the DUT match the predictive outcome, producing an indication of the match to a user of the test device, wherein the indication includes a predicted longevity of the DUT.
A method of generating and using predictive outcomes, comprising:
- receiving data representing operating information about one or more DUTs;
- determining commonalities in test results of the one or more DUTs generated during previous margin testing to match past test results to the operating information;
- creating a list of the past test results that are matched to the operating information;
- testing a DUT related to the one or more DUTs during one or more testing states of a test session to generate present test results;
- comparing the present test results to the list of past test results;
- and
- generating an indication when the present test results match any of the past test results on the list of past test results, wherein the indication includes a predicted incidence of failure of the DUT.
Dependencies are inferred from the claim text.