G01R 31/282
Testing of electronic circuits specially adapted for particular applications not provided for
Official title: {Testing of electronic circuits specially adapted for particular applications not provided for elsewhere (G01R31/2801 and G01R31/2851 take precedence)}
G01R31/282 (Testing of electronic circuits specially adapted for particular applications not provided for) appears on 3,190 US grants and 2,846 published applications in this corpus.
Search patents in G01R- Granted patents
- 3,190
- Published applications
- 2,846
- Assignees
- 1,372
- Inventors
- 6,957
- Latest grant
- 6 Oct 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 4 | 0 |
| 1977 | 2 | 0 |
| 1978 | 4 | 0 |
| 1979 | 2 | 0 |
| 1980 | 2 | 0 |
| 1981 | 5 | 0 |
| 1982 | 9 | 0 |
| 1983 | 3 | 0 |
| 1984 | 10 | 0 |
| 1985 | 9 | 0 |
| 1986 | 7 | 0 |
| 1987 | 10 | 0 |
| 1988 | 13 | 0 |
| 1989 | 13 | 0 |
| 1990 | 11 | 0 |
| 1991 | 20 | 0 |
| 1992 | 23 | 0 |
| 1993 | 17 | 0 |
| 1994 | 26 | 0 |
| 1995 | 39 | 0 |
| 1996 | 51 | 0 |
| 1997 | 66 | 0 |
| 1998 | 55 | 0 |
| 1999 | 53 | 0 |
| 2000 | 72 | 0 |
| 2001 | 72 | 25 |
| 2002 | 90 | 78 |
| 2003 | 70 | 73 |
| 2004 | 86 | 77 |
| 2005 | 67 | 90 |
| 2006 | 91 | 109 |
| 2007 | 79 | 91 |
| 2008 | 66 | 83 |
| 2009 | 61 | 75 |
| 2010 | 72 | 81 |
| 2011 | 52 | 59 |
| 2012 | 63 | 70 |
| 2013 | 48 | 67 |
| 2014 | 60 | 96 |
| 2015 | 70 | 124 |
| 2016 | 109 | 112 |
| 2017 | 123 | 127 |
| 2018 | 136 | 161 |
| 2019 | 177 | 197 |
| 2020 | 182 | 192 |
| 2021 | 204 | 185 |
| 2022 | 167 | 165 |
| 2023 | 179 | 143 |
| 2024 | 139 | 131 |
| 2025 | 112 | 145 |
| 2026 | 89 | 90 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
- G01R 31/2831Testing of materials or semi-finished products1,182
- G01R 31/2822Of microwave or radiofrequency circuits840
- G01R 31/2829Testing of circuits in sensor or actuator systems754
- G01R 31/2825In household appliances or professional audio/video equipment264
- G01R 31/2827Testing of electronic protection circuits118
Recent patents
- Self-test auto monitor ground fault circuit interrupter (GFCI) with power denial6 Oct 2026US 12,754,232 B2Hubbell Incorporated
- Carrier-resolved hall measurement with multi-harmonic magnetoresistance analysis22 Sep 2026US 12,742,812 B2International Business Machines Corporation
- Packages and processes for radio frequency mitigation and self-test22 Sep 2026US 12,743,133 B2Apple Inc.
- Vapor cells having optical windows with multilayer coatings15 Sep 2026US 12,736,570 B2Quantum Valley Ideas Laboratories
- Test fixture set and testing method15 Sep 2026US 12,736,572 B2Universal Scientific Industrial (Shanghai) Co., Ltd.
- Test device1 Oct 2026US 2026/0298993 A1Leeno Industrial Inc.
- Work string tubing connection restoration24 Sep 2026US 2026/0284768 A1Postle Industries, Inc.
- Ground Fault Circuit Interrupter with Solid State Relay-Controlled Electromagnetic Contactor and Self-Test End of Life (STEOL) Circuits for High-Current Applications24 Sep 2026US 2026/0291206 A1Tower Manufacturing Corporation
- Low cost on-chip built-in self-test architecture for millimeter wave radio freqency integrated circuit24 Sep 2026US 2026/0291625 A1Samsung Electronics Co., Ltd.
- Millimeter-wave vector network analyzer17 Sep 2026US 2026/0276674 A1Ohio State Innovation Foundation
Most cited
By later US patents
- Method and apparatus for integrated wafer handling and testing404US 6,164,894 A2000
- Making and testing an integrated circuit using high density probe points307US 5,103,557 A1992
- Method and apparatus for wireless radio frequency testing of RFID integrated circuits290US 6,236,223 B1Intermec IP Corp. · 2001
- Method of making a flexible tester surface for testing integrated circuits253US 5,020,219 A1991
- Method for forming an interconnect having a penetration limited contact structure for establishing a temporary electrical connection with a semiconductor die241US 5,686,317 AMicron Technology, Inc. · 1997