Test device
AssigneeLeeno Industrial Inc.
InventorsJaehwan JEONG, Jaehun KIM
Life of this patent
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Abstract
Disclosed is a test device for testing characteristics of a subject-to-be-tested with a built-in antenna that emits a wireless signal. The test device includes: a signal probe including one end portion to be in contact with a first terminal of the subject-to-be-tested to transmit a test signal; a ground probe to be in contact with a second terminal of the subject-to-be-tested; and a socket block including a probe supporter to support the signal probe and the ground probe, and a waveguide corresponding to the antenna of the subject-to-be-tested and penetrating therethrough in a lengthwise direction of the signal probe to measure the wireless signal in a different area from the probe supporter.
Claims6
A test device for testing characteristics of a subject-to-be-tested with a built-in antenna that emits a wireless signal, the test device comprising:
- a signal probe comprising one end portion to be in contact with a first terminal of the subject-to-be-tested to transmit a test signal;
- a ground probe to be in contact with a second terminal of the subject-to-be-tested;
- and
- a socket block comprising a probe supporter to support the signal probe and the ground probe, and a waveguide corresponding to the antenna of the subject-to-be-tested and penetrating therethrough in a lengthwise direction of the signal probe to measure the wireless signal in a different area from the probe supporter.
Dependencies are inferred from the claim text.