G01R 31/30
Marginal testing
Official title: Marginal testing, e.g. by varying supply voltage (testing computers during standby operation or idle time G06F11/22)
G01R31/30 (Marginal testing) appears on 1,834 US grants and 1,277 published applications in this corpus.
Search patents in G01R- Granted patents
- 1,834
- Published applications
- 1,277
- Assignees
- 527
- Inventors
- 3,213
- Latest grant
- 29 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 1 | 0 |
| 1977 | 2 | 0 |
| 1978 | 2 | 0 |
| 1979 | 0 | 0 |
| 1980 | 1 | 0 |
| 1981 | 0 | 0 |
| 1982 | 0 | 0 |
| 1983 | 1 | 0 |
| 1984 | 2 | 0 |
| 1985 | 5 | 0 |
| 1986 | 3 | 0 |
| 1987 | 4 | 0 |
| 1988 | 5 | 0 |
| 1989 | 8 | 0 |
| 1990 | 16 | 0 |
| 1991 | 13 | 0 |
| 1992 | 18 | 0 |
| 1993 | 14 | 0 |
| 1994 | 26 | 0 |
| 1995 | 30 | 0 |
| 1996 | 36 | 0 |
| 1997 | 53 | 0 |
| 1998 | 63 | 0 |
| 1999 | 70 | 0 |
| 2000 | 76 | 0 |
| 2001 | 85 | 24 |
| 2002 | 71 | 60 |
| 2003 | 55 | 66 |
| 2004 | 92 | 86 |
| 2005 | 84 | 88 |
| 2006 | 79 | 89 |
| 2007 | 75 | 88 |
| 2008 | 88 | 89 |
| 2009 | 74 | 59 |
| 2010 | 85 | 63 |
| 2011 | 59 | 42 |
| 2012 | 45 | 39 |
| 2013 | 39 | 31 |
| 2014 | 37 | 37 |
| 2015 | 26 | 22 |
| 2016 | 36 | 27 |
| 2017 | 35 | 41 |
| 2018 | 28 | 26 |
| 2019 | 33 | 36 |
| 2020 | 31 | 44 |
| 2021 | 42 | 45 |
| 2022 | 40 | 35 |
| 2023 | 46 | 46 |
| 2024 | 38 | 42 |
| 2025 | 45 | 33 |
| 2026 | 17 | 19 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Low current leakage measurement on a high current unified static and dynamic characterization platform29 Sep 2026US 12,748,145 B2Keithley Instruments, LLC
- Benchmark circuit on a semiconductor wafer and method for operating the same25 Aug 2026US 12,716,941 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Apparatus for measuring a gate leakage current of a transistor30 Jun 2026US 12,669,538 B2City University of Hong Kong
- Semiconductor burn-in machine power regulator having multiple power modes30 Jun 2026US 12,671,397 B2Micro Control Company
- Characterizing path margin monitors without the use of scan chains16 Jun 2026US 12,656,391 B2Synopsys, Inc.
- Die-to-die connectivity monitoring24 Sep 2026US 2026/0287651 A1Proteantecs Ltd.
- Analog circuit having reconfiguration means for a stress test and/or for an iddq test, and associated methods3 Sep 2026US 2026/0259258 A1Elmos Semiconductor AG
- Voltage measurement circuit3 Sep 2026US 2026/0259273 A1Nuvoton Technology Corporation Japan
- Systems and methods for determining operation parameters of quantum dot forming regions27 Aug 2026US 2026/0251696 A1Conductor Quantum, Inc.
- Verification response method for consumable chip and verification method for consumable container20 Aug 2026US 2026/0244887 A1Zhuhai Print-Rite Microelectronics Corporation
Most cited
By later US patents
- Self-test and status reporting system for microcontroller-controlled devices1,247US 6,104,304 AConexant Systems, Inc. · 2000
- Electronic component failure indicator253US 5,673,028 A1997
- Discrete die burn-in for nonpackaged die225US 4,899,107 AMicron Technology, Inc. · 1990
- Semiconductor array having built-in test circuit for wafer level testing149US 5,457,400 AMicron Technology, Inc. · 1995
- Integrated circuit test apparatus test head129US 4,517,512 AMicro Component Technology, Inc. · 1985