Benchmark circuit on a semiconductor wafer and method for operating the same

A benchmark circuit, comprising:

• a first PCM device;
• a second PCM device;
• a first switching circuit configured to selectively couple the first PCM device and the second PCM device to receive a test signal from an external signal generator;
• a second switching circuit configured to selectively couple the first PCM device or the second PCM device to obtain an output signal from the first PCM device or the second PCM device;
• and
• an adjustment circuit coupled to the second switching circuit and configured to adjust the output signal, wherein the adjustment circuit comprises:
• a first adjuster connected to the second switching circuit, the first adjuster configured to adjust a frequency of the output signal of the first PCM device to be a first adjusted signal when the second switching circuit configured to selectively couple to the first PCM device;
• and
• a second adjuster connected to the first adjuster and configured to adjust a frequency of the first adjusted signal to be a second adjusted signal.

A semiconductor wafer, comprising:

• a conductive contact;
• and
• a benchmark circuit embedded on the semiconductor wafer, the benchmark circuit comprising:
• a number N of oscillators;
• a first frequency divider;
• a first switching circuit configured to selectively connect one of the number N of oscillators to the conductive contact to receive a test signal;
• and
• a second switching circuit configured to selectively connect one of the number N of oscillators to the first frequency divider.