G01R 31/3016
Delay or race condition test
Official title: {Delay or race condition test, e.g. race hazard test}
G01R31/3016 (Delay or race condition test) appears on 541 US grants and 390 published applications in this corpus.
Search patents in G01R- Granted patents
- 541
- Published applications
- 390
- Assignees
- 188
- Inventors
- 875
- Latest grant
- 25 Aug 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1983 | 1 | 0 |
| 1984 | 0 | 0 |
| 1985 | 0 | 0 |
| 1986 | 1 | 0 |
| 1987 | 1 | 0 |
| 1988 | 0 | 0 |
| 1989 | 3 | 0 |
| 1990 | 0 | 0 |
| 1991 | 1 | 0 |
| 1992 | 2 | 0 |
| 1993 | 3 | 0 |
| 1994 | 4 | 0 |
| 1995 | 6 | 0 |
| 1996 | 6 | 0 |
| 1997 | 5 | 0 |
| 1998 | 12 | 0 |
| 1999 | 13 | 0 |
| 2000 | 30 | 0 |
| 2001 | 32 | 11 |
| 2002 | 31 | 21 |
| 2003 | 21 | 26 |
| 2004 | 34 | 37 |
| 2005 | 37 | 35 |
| 2006 | 25 | 30 |
| 2007 | 23 | 23 |
| 2008 | 29 | 36 |
| 2009 | 35 | 26 |
| 2010 | 34 | 25 |
| 2011 | 27 | 12 |
| 2012 | 16 | 8 |
| 2013 | 12 | 10 |
| 2014 | 7 | 5 |
| 2015 | 8 | 2 |
| 2016 | 6 | 3 |
| 2017 | 3 | 7 |
| 2018 | 6 | 5 |
| 2019 | 5 | 7 |
| 2020 | 4 | 4 |
| 2021 | 6 | 6 |
| 2022 | 8 | 11 |
| 2023 | 14 | 14 |
| 2024 | 12 | 13 |
| 2025 | 11 | 11 |
| 2026 | 7 | 2 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Benchmark circuit on a semiconductor wafer and method for operating the same25 Aug 2026US 12,716,941 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Characterizing path margin monitors without the use of scan chains16 Jun 2026US 12,656,391 B2Synopsys, Inc.
- Test and repair of interconnects between chips9 Jun 2026US 12,650,459 B2Intel Corporation
- Die-to-die connectivity monitoring2 Jun 2026US 12,644,924 B2Proteantecs Ltd.
- Diagnostic ring oscillator circuit for DC and transient characterization12 May 2026US 12,625,180 B2Intel NDTM US LLC
- Die-to-die connectivity monitoring24 Sep 2026US 2026/0287651 A1Proteantecs Ltd.
- Diagnostic ring oscillator circuit for dc and transient characterization5 Mar 2026US 2026/0063715 A1Intel NDTM US LLC
- Integrated circuit margin measurement for the detection of rare events30 Oct 2025US 2025/0334633 A1Proteantecs Ltd.
- Critical path sensitization in electronic systems30 Oct 2025US 2025/0334635 A1NXP B. V.
- Apparatus and method for implementing a scalable digital infrastructure for measuring ring oscillators9 Oct 2025US 2025/0315078 A1Tokyo Electron U.S. Holdings, Inc.
Most cited
By later US patents
- Method and apparatus for verifying timing during simulation of digital circuits123US 5,095,454 AGateway Design Automation Corporation · 1992
- Efficient fir filter for high-speed communication118US 6,272,173 B1Broadcom Corporation · 2001
- On-chip signal state duration measurement and adjustment109US 7,036,098 B2Sun Microsystems, Inc. · 2006
- Changing clock frequency103US 6,118,306 AIntel Corporation · 2000
- Pair-swap independent trellis decoder for a multi-pair gigabit transceiver95US 6,865,234 B1Broadcom Corporation · 2005