On-chip signal state duration measurement and adjustment
AssigneeSun Microsystems, Inc.
InventorsNadeem N. Eleyan, Harsh D. Sharma, Howard L. Levy, Hong S. Kim
Life of this patent
Estimating the term…
Loading patent…
AssigneeSun Microsystems, Inc.
InventorsNadeem N. Eleyan, Harsh D. Sharma, Howard L. Levy, Hong S. Kim
Estimating the term…
Signal state durations, such as the pulse-width, of on-chip signals are often critical to the successful operation of an integrated circuit. The signal state durations measured by on-chip technology provide signal state duration information to an on-chip signal state duration control system. The signal state duration control system uses the information to adjust the signal state duration of an on-chip signal. In one embodiment, the signal state duration of the on-chip signal is the pulse width of the on-chip signal. The signal duration measurement and adjustment system is, for example, useful for measuring the state duration of signals such as self-resetting signals, which are difficult to externally measure and adjust signal state durations using on-chip technology.
A method of adjusting a signal state duration of an on-chip signal using one or more on-chip systems, the method comprising:
An apparatus having one or more on-chip systems to determine and adjust a signal state duration of one or more on-chip signals, the apparatus comprising:
An integrated circuit having a system to adjust a signal state duration of an on-chip signal using one or more on-chip systems, the integrated circuit comprising:
Dependencies are inferred from the claim text.