Characterizing path margin monitors without the use of scan chains
AssigneeSynopsys, Inc.
InventorsGulve Rohini Vasant, Durga Prasad Bade, Abhishek Das, Santosh Kumar
Life of this patent
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Abstract
An integrated circuit device includes scan chains and path margin monitor units (PMUs) on a single die. The scan chains test signal paths in the integrated circuit device. The PMUs include path monitor circuitry and self-test circuitry. The path monitor circuitry monitor delays of signals propagating along the signal paths. The self-test circuitry test the path monitor circuitry and report the test results via a communications path other than the scan chains.
Claims20
An integrated circuit device comprising a plurality of path margin monitor units (PMUs) comprising:
- path monitor circuitry that monitor delays of signals propagating along signal paths in the integrated circuit device;
- and
- self-test circuitry that test the path monitor circuitry and report test results via a communications path other than scan chains used to test the signal paths in the integrated circuit device.
A method comprising:
- sending control signals to a plurality of path margin monitor units (PMUs) circuits to control operation of the PMUs;
- wherein the PMUs are operable in a monitor mode and in a self-test mode, in the monitor mode the PMUs monitor delays of signals propagating along signal paths in an integrated circuit device, and in the self-test mode the PMUs run self tests;
- and
- receiving monitor results of the monitor mode and receiving test results from the self-test mode, wherein the monitor results and test results are received via a communications path other than scan chains used to test the signal paths on the integrated circuit device.
A non-transitory computer readable medium comprising stored instructions, which when executed by a processing device, cause the processing device to:
- insert a plurality of path margin monitor units (PMUs) into a design of an integrated circuit, wherein the PMUs are operable in a monitor mode that monitor delays of signals propagating along signal paths in the integrated circuit and in a self-test mode that tests the PMUs;
- and
- insert a communications path for the PMUs to report results of the self-test mode, wherein the communications path is separate from scan chains used to test the signal paths in the integrated circuit.
Dependencies are inferred from the claim text.