G01R 31/3004
Current or voltage test
Official title: {Current or voltage test}
G01R31/3004 (Current or voltage test) appears on 1,046 US grants and 808 published applications in this corpus.
Search patents in G01R- Granted patents
- 1,046
- Published applications
- 808
- Assignees
- 371
- Inventors
- 1,910
- Latest grant
- 29 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1980 | 1 | 0 |
| 1981 | 0 | 0 |
| 1982 | 0 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 4 | 0 |
| 1986 | 1 | 0 |
| 1987 | 2 | 0 |
| 1988 | 1 | 0 |
| 1989 | 1 | 0 |
| 1990 | 1 | 0 |
| 1991 | 6 | 0 |
| 1992 | 4 | 0 |
| 1993 | 2 | 0 |
| 1994 | 10 | 0 |
| 1995 | 11 | 0 |
| 1996 | 13 | 0 |
| 1997 | 28 | 0 |
| 1998 | 32 | 0 |
| 1999 | 36 | 0 |
| 2000 | 35 | 0 |
| 2001 | 50 | 17 |
| 2002 | 41 | 40 |
| 2003 | 28 | 37 |
| 2004 | 61 | 46 |
| 2005 | 47 | 46 |
| 2006 | 47 | 55 |
| 2007 | 48 | 57 |
| 2008 | 53 | 46 |
| 2009 | 36 | 36 |
| 2010 | 52 | 39 |
| 2011 | 32 | 33 |
| 2012 | 33 | 23 |
| 2013 | 24 | 16 |
| 2014 | 23 | 23 |
| 2015 | 13 | 18 |
| 2016 | 23 | 21 |
| 2017 | 30 | 30 |
| 2018 | 19 | 20 |
| 2019 | 23 | 25 |
| 2020 | 23 | 35 |
| 2021 | 35 | 35 |
| 2022 | 31 | 20 |
| 2023 | 29 | 31 |
| 2024 | 17 | 24 |
| 2025 | 30 | 19 |
| 2026 | 10 | 16 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Low current leakage measurement on a high current unified static and dynamic characterization platform29 Sep 2026US 12,748,145 B2Keithley Instruments, LLC
- Apparatus for measuring a gate leakage current of a transistor30 Jun 2026US 12,669,538 B2City University of Hong Kong
- Semiconductor burn-in machine power regulator having multiple power modes30 Jun 2026US 12,671,397 B2Micro Control Company
- Circuit screening system and circuit screening method16 Jun 2026US 12,656,395 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Method, device, and system for processing transmission line pulse data5 May 2026US 12,618,890 B2AIP Technology Corporation
- Analog circuit having reconfiguration means for a stress test and/or for an iddq test, and associated methods3 Sep 2026US 2026/0259258 A1Elmos Semiconductor AG
- Systems and methods for determining operation parameters of quantum dot forming regions27 Aug 2026US 2026/0251696 A1Conductor Quantum, Inc.
- Verification response method for consumable chip and verification method for consumable container20 Aug 2026US 2026/0244887 A1Zhuhai Print-Rite Microelectronics Corporation
- Testing method and testing device for electronic circuit16 Jul 2026US 2026/0202465 A1United Microelectronics Corp.
- Generation method for chip internal voltage prediction model, prediction method and related apparatus16 Jul 2026US 2026/0203640 A1Hygon Information Technology Co., Ltd.
Most cited
By later US patents
- Self-test and status reporting system for microcontroller-controlled devices1,247US 6,104,304 AConexant Systems, Inc. · 2000
- Integrated circuit test apparatus test head129US 4,517,512 AMicro Component Technology, Inc. · 1985
- Smart battery129US 5,747,189 AValence Technology, Inc. · 1998
- Method and apparatus for performing operative testing on an integrated circuit118US 5,929,650 AMotorola, Inc. · 1999
- Efficient fir filter for high-speed communication118US 6,272,173 B1Broadcom Corporation · 2001