G01R 31/3012
Built-in-current test [bic]
Official title: {Built-In-Current test [BIC]}
G01R31/3012 (Built-in-current test [bic]) appears on 37 US grants and 33 published applications in this corpus.
Search patents in G01R- Granted patents
- 37
- Published applications
- 33
- Assignees
- 27
- Inventors
- 81
- Latest grant
- 23 Dec 2025
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1994 | 1 | 0 |
| 1995 | 1 | 0 |
| 1996 | 1 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 1 | 0 |
| 2001 | 1 | 0 |
| 2002 | 1 | 3 |
| 2003 | 1 | 3 |
| 2004 | 3 | 4 |
| 2005 | 7 | 3 |
| 2006 | 2 | 4 |
| 2007 | 4 | 0 |
| 2008 | 1 | 2 |
| 2009 | 0 | 0 |
| 2010 | 0 | 1 |
| 2011 | 1 | 1 |
| 2012 | 1 | 2 |
| 2013 | 1 | 0 |
| 2014 | 0 | 0 |
| 2015 | 0 | 0 |
| 2016 | 1 | 1 |
| 2017 | 2 | 1 |
| 2018 | 2 | 1 |
| 2019 | 0 | 0 |
| 2020 | 0 | 2 |
| 2021 | 1 | 2 |
| 2022 | 3 | 0 |
| 2023 | 0 | 0 |
| 2024 | 0 | 0 |
| 2025 | 1 | 1 |
| 2026 | 0 | 2 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Continuously variable electronic load tester for use with nuclear instrumentation system high voltage power supplies23 Dec 2025US 12,504,469 B2Westinghouse Electric Corp.
- Integrated circuit with current limit testing circuitry15 Nov 2022US 11,500,010 B2Texas Instruments Incorporated
- Sensor integrated circuit load current monitoring circuitry and associated methods30 Aug 2022US 11,428,731 B2Allegro MicroSystems, LLC
- Current measurement apparatus including charge/discharge means and current measurement method using same22 Feb 2022US 11,255,886 B2Phosphil Inc.
- Sensor integrated circuit load current monitoring circuitry and associated methods16 Mar 2021US 10,948,537 B2Allegro MicroSystems, LLC
- Continuously variable electronic load tester for use with nuclear instrumentation system high voltage power supplies16 Apr 2026US 2026/0104452 A1Westinghouse Electric Corp.
- Signal testing15 Jan 2026US 2026/0016536 A1Micron Technology, Inc.
- Continuously variable electronic load tester for use with nuclear instrumentation system high voltage power supplies24 Jul 2025US 2025/0237698 A1Westinghouse Electric Corp.
- Integrated circuit with current limit testing circuitry22 Jul 2021US 2021/0223306 A1Texas Instruments Incorporated
- Sensor integrated circuit load current monitoring circuitry and associated methods3 Jun 2021US 2021/0165038 A1Allegro MicroSystems, LLC
Most cited
By later US patents
- System and method for IDDQ measurement in system on a chip (SOC) design69US 7,282,905 B2Texas Instruments Incorporated · 2007
- Test access port controlled built in current monitor for IC devices39US 5,459,737 ANational Semiconductor Corporation · 1995
- Dynamic register with IDDQ testing capability32US 6,411,117 B1Broadcom Corporation · 2002
- Test detector/shutoff and method for BiCMOS integrated circuit23US 5,294,883 AInternational Business Machines Corporation · 1994
- Method and apparatus for use in IDDQ integrated circuit testing20US 6,144,214 AUniversity of South Florida · 2000