G01R 31/3008
Quiescent current [iddq] test or leakage current test
Official title: {Quiescent current [IDDQ] test or leakage current test}
G01R31/3008 (Quiescent current [iddq] test or leakage current test) appears on 351 US grants and 287 published applications in this corpus.
Search patents in G01R- Granted patents
- 351
- Published applications
- 287
- Assignees
- 151
- Inventors
- 592
- Latest grant
- 29 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1994 | 2 | 0 |
| 1995 | 2 | 0 |
| 1996 | 5 | 0 |
| 1997 | 4 | 0 |
| 1998 | 10 | 0 |
| 1999 | 7 | 0 |
| 2000 | 7 | 0 |
| 2001 | 19 | 8 |
| 2002 | 14 | 17 |
| 2003 | 11 | 9 |
| 2004 | 24 | 30 |
| 2005 | 25 | 23 |
| 2006 | 20 | 21 |
| 2007 | 20 | 19 |
| 2008 | 22 | 15 |
| 2009 | 15 | 21 |
| 2010 | 22 | 18 |
| 2011 | 14 | 13 |
| 2012 | 19 | 7 |
| 2013 | 8 | 6 |
| 2014 | 7 | 9 |
| 2015 | 6 | 4 |
| 2016 | 5 | 6 |
| 2017 | 11 | 8 |
| 2018 | 6 | 8 |
| 2019 | 4 | 3 |
| 2020 | 9 | 9 |
| 2021 | 8 | 8 |
| 2022 | 3 | 4 |
| 2023 | 7 | 5 |
| 2024 | 6 | 9 |
| 2025 | 6 | 5 |
| 2026 | 3 | 2 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Low current leakage measurement on a high current unified static and dynamic characterization platform29 Sep 2026US 12,748,145 B2Keithley Instruments, LLC
- Apparatus for measuring a gate leakage current of a transistor30 Jun 2026US 12,669,538 B2City University of Hong Kong
- Method, device, and system for processing transmission line pulse data5 May 2026US 12,618,890 B2AIP Technology Corporation
- System for determining leakage current of a field effect transistor over temperature30 Sep 2025US 12,429,515 B2Texas Instruments Incorporated
- Current measurement architecture8 Jul 2025US 12,352,826 B2Arm Limited
- Analog circuit having reconfiguration means for a stress test and/or for an iddq test, and associated methods3 Sep 2026US 2026/0259258 A1Elmos Semiconductor AG
- Built-in self-test (bist) circuit, integrated circuit device and method5 Mar 2026US 2026/0063708 A1Taiwan Semiconductor Manufacturing Company.Ltd
- Apparatus for measuring a gate leakage current of a transistor6 Nov 2025US 2025/0341565 A1City University of Hong Kong
- Leakage current detection circuit28 Aug 2025US 2025/0271499 A1SK hynix Inc.
- Tester apparatus, testing method and leakage detection circuit7 Aug 2025US 2025/0251438 A1Aehr Test Systems
Most cited
By later US patents
- Method and apparatus for performing operative testing on an integrated circuit118US 5,929,650 AMotorola, Inc. · 1999
- Efficient fir filter for high-speed communication118US 6,272,173 B1Broadcom Corporation · 2001
- Systems and methods for testing packaged dies107US 7,075,175 B2QUALCOMM Incorporated · 2006
- Method and apparatus to test for current in an integrated circuit101US 5,371,457 A1994
- High speed I.sub.DDQ monitor circuit100US 5,694,063 ALTX Corporation · 1997