Current measurement architecture
AssigneeArm Limited
InventorsAshwani Kumar Srivastava, Yves Thomas Laplanche, Ramesh Manohar
Life of this patent
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Abstract
Various implementations described herein are related to a device with fabrication test circuitry having transistors arranged in a parallel branch configuration between a supply voltage and a single pad. In some applications, each transistor in an off-current branch may be separately deactivated so as to test leakage current applied to the pad by way of the off-current branch, and also, each transistor in an on-current branch may be deactivated so as to further test the leakage current applied to the pad by way of the off-current branch.
Claims20
A device comprising:
- fabrication test circuitry with transistors arranged in a parallel branch configuration between a supply voltage and a single pad,
- wherein each transistor in an off-current branch is separately deactivated so as to test leakage current applied to the single pad by way of the off-current branch, and
- wherein each transistor in an on-current branch is deactivated so as to further test the leakage current applied to the single pad by way of the off-current branch.
A device comprising:
- fabrication test circuitry with transistors arranged in a parallel branch configuration between a supply voltage and a single pad,
- wherein each transistor in each on-current branch is separately activated so as to test drive current applied to the single pad by way of each on-current branch, and
- wherein each transistor in an off-current branch is deactivated so as to further test the drive current applied to the single pad by way of each on-current branch.
A method comprising:
- manufacturing a fabrication test circuit with transistors coupled in parallel branches between a supply voltage and a single pad, and
- measuring leakage current in each parallel branch by separately deactivating each transistor to test leakage current applied to the single pad.
A method comprising:
- manufacturing a fabrication test circuit with transistors coupled in parallel branches between a supply voltage and a single pad;
- and
- measuring drive current in each parallel branch by activating each transistor to test drive current applied to the single pad.
Dependencies are inferred from the claim text.