Testing method and testing device for electronic circuit
AssigneeUnited Microelectronics Corp.
InventorLu Qi
Life of this patent
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Abstract
A testing method and a testing device for an electronic circuit are provided. The testing method includes the following steps. A test voltage signal is provided to a connection pad of the electronic circuit. A voltage regulating circuit of the electronic circuit is controlled to generate a reference voltage and provide the reference voltage to the connection pad. A voltage value of one of the test voltage signal and the reference voltage is adjusted, and a test current flowing through the connection pad is received. A measured voltage value of the reference voltage is determined according to a change in a current direction of the test current.
Claims20
A testing method for an electronic circuit, comprising:
- providing a test voltage signal to a connection pad of the electronic circuit;
- controlling a voltage regulating circuit of the electronic circuit to generate a reference voltage and providing the reference voltage to the connection pad;
- adjusting a voltage value of one of the test voltage signal and the reference voltage, and receiving a test current flowing through the connection pad;
- and
- determining a measured voltage value of the reference voltage according to a change in a current direction of the test current.
A testing device for an electronic circuit, comprising:
- a voltage generator connected to a connection pad of the electronic circuit and configured to provide a test voltage signal to the connection pad of the electronic circuit;
- a controller connected to the electronic circuit, and configured to control the electronic circuit to generate a reference voltage and provide the reference voltage to the connection pad, and adjust a voltage value of one of the test voltage signal and the reference voltage;
- and
- a current sensor connected to the connection pad and configured to receive a test current flowing through the connection pad,
- wherein the controller determines a measured voltage value of the reference voltage according to a change in a current direction of the test current.
Dependencies are inferred from the claim text.