Method and device of manufacturing semiconductor device

Abstract

A method of manufacturing a semiconductor device includes: using a semiconductor element to be inspected as a first semiconductor element; using a semiconductor element for obtaining teaching data as a second semiconductor element; obtaining teaching data including a plurality of data related to characteristics of the second semiconductor element; creating a trained model using the teaching data; and determining whether to perform electric test of the first semiconductor element based on an output obtained by inputting a plurality of data related to characteristics of the first semiconductor element into the trained model.

Dependencies are inferred from the claim text.