Integrated circuits having post-silicon adjustment control

A MEMS device having a programmable reference table in which data is entered after fabrication of said MEMS.

In an integrated circuit system having a programmable reference data table for holding information used to control at least one of operation voltage, operating clock speed, and temperature range in a power supply circuit, a body bias control circuit, a clock delivery circuit, a temperature monitor circuit, and a configuration control circuit, a method of improving the performance of said system comprising

• (A) obtaining system performance data by testing said system at at least two parameters selected from the group consisting of different supply voltages, different body-bias voltages, different clock speeds, different temperatures, different data bus widths, different circuit block configurations, and combinations thereof, where at least one of said parameters is different temperatures;
• and
• (B) entering values based on said data into said reference data table, where said temperature monitor circuit and at least one of said operation voltage, operating body-bias voltage, operating clock speed, and temperature range in said power supply circuit, body bias control circuit, clock circuit, clock delivery circuit, or configuration control circuit is controlled using said values.

In an integrated circuit system having access to a reference data table, at least two same function circuit blocks, and a control circuit to control which of said circuit blocks executes a task, based on values in said reference data table, a method of improving the performance of said system comprising

• (A) obtaining system performance data by testing said system at at least two parameters selected from the group consisting of different supply voltages, different body-bias voltages, different clock speeds, different temperatures, different data bus widths, different circuit block configurations, and combinations thereof, where at least one of said parameters is different temperatures;
• and
• (B) entering values based on said data into said reference data table, whereby said control circuit selects or configures one of said blocks based on values in said reference data table.

In an integrated circuit system having access to a reference data table for holding information used to control at least one circuit block in said system and having at least two of a power supply circuit, a body bias control circuit, a clock delivery circuit, a temperature monitor circuit, and a configuration control circuit, the improvement comprising a reference data table having values based on system performance data obtained by testing said system at at least two parameters selected from the group consisting of different supply voltages, different body-bias voltages, different clock speeds, different temperatures, different data bus widths, different circuit block configurations, and combinations thereof, where at least one of said parameters is different temperatures, entered into said reference data table, where said temperature monitor circuit and at least one of said power supply circuit, said body bias control circuit, said clock delivery circuit, or said configuration control circuit is controlled using said values.