G01R 31/31724
Test controller
Official title: {Test controller, e.g. BIST state machine (for scan test G01R31/318555)}
G01R31/31724 (Test controller) appears on 536 US grants and 547 published applications in this corpus.
Search patents in G01R- Granted patents
- 536
- Published applications
- 547
- Assignees
- 180
- Inventors
- 917
- Latest grant
- 15 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1984 | 1 | 0 |
| 1985 | 0 | 0 |
| 1986 | 0 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 1 | 0 |
| 1990 | 0 | 0 |
| 1991 | 1 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 3 | 0 |
| 1995 | 1 | 0 |
| 1996 | 1 | 0 |
| 1997 | 1 | 0 |
| 1998 | 2 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 5 | 2 |
| 2002 | 1 | 6 |
| 2003 | 8 | 10 |
| 2004 | 6 | 11 |
| 2005 | 6 | 11 |
| 2006 | 9 | 9 |
| 2007 | 6 | 12 |
| 2008 | 19 | 23 |
| 2009 | 15 | 17 |
| 2010 | 17 | 14 |
| 2011 | 21 | 15 |
| 2012 | 17 | 19 |
| 2013 | 16 | 16 |
| 2014 | 17 | 24 |
| 2015 | 22 | 26 |
| 2016 | 33 | 41 |
| 2017 | 30 | 45 |
| 2018 | 36 | 35 |
| 2019 | 34 | 31 |
| 2020 | 29 | 21 |
| 2021 | 37 | 39 |
| 2022 | 30 | 33 |
| 2023 | 40 | 33 |
| 2024 | 38 | 21 |
| 2025 | 19 | 18 |
| 2026 | 14 | 15 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Chip testing method and apparatus15 Sep 2026US 12,736,583 B2Xiamen Industrial Technology Research Institute Co., Ltd.
- Loopback test for phase interpolator codes8 Sep 2026US 12,730,150 B1Cadence Design Systems, Inc.
- Benchmark circuit on a semiconductor wafer and method for operating the same25 Aug 2026US 12,716,941 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Built-in self-test for on-chip error detection4 Aug 2026US 12,699,132 B1Auradine, Inc.
- Defect detecting system of automotive apparatus30 Jun 2026US 12,669,532 B2Samsung Electronics Co., Ltd.
- Built-in self-test arrangement for a digital-to-analog converter3 Sep 2026US 2026/0259260 A1Infineon Technologies AG
- Self-test system for application-specific integrated circuit (asic) devices27 Aug 2026US 2026/0251709 A1Micron Technology, Inc.
- Fault injection and deterministic repair for debug of packaged semiconductor dies2 Jul 2026US 2026/0186052 A1Intel Corporation
- Non-destructive fault detecting method and system using debug access ports25 Jun 2026US 2026/0177612 A1
- Methods, systems, and computer readable media for testing the performance and reliability of a device or system under test (sut) using real and emulated processing ranks within a data center environment18 Jun 2026US 2026/0169064 A1Keysight Technologies, Inc.
Most cited
By later US patents
- Semiconductor chip repair by stacking of a base semiconductor chip and a repair semiconductor chip182US 8,679,861 B2International Business Machines Corporation · 2014
- Remote test module for automatic test equipment105US 6,275,962 B1Teradyne, Inc. · 2001
- Integrated circuit having built-in self-test features88US 7,694,200 B2Allegro MicroSystems, LLC · 2010
- Programmable logic core adapter74US 6,744,274 B1Stretch, Inc. · 2004
- Generator/compactor scan circuit low power adapter with counter68US 6,763,488 B2Texas Instruments Incorporated · 2004